Ferroelectric Memory Device Nested Electrode Capacitance

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Solution Overview

Problem

Ferroelectric memory devices face limitations in capacitance, which affects their performance and efficiency, particularly in non-volatile memory applications requiring low operational voltage, low power consumption, and high-speed operation.

Innovation Solution

The proposed solution involves a ferroelectric memory device structure with a '2T-2C' configuration, where each memory cell includes two transistors and two capacitors, with a ferroelectric layer sandwiched between the electrodes, and a method for forming these cells that includes multiple conductive and ferroelectric material layers to enhance capacitance by optimizing the electrode geometry and layer formation processes.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Shape

If conventional ferroelectric capacitor structures are used, then device simplicity is maintained, but capacitance is insufficient for low-voltage operation

Engineering Contradiction:
Improvecapacitor structureVSAvoidcapacitance
Core Design Contradiction:
ShapeVSReliability

Solution Approach 1:

The patent implements a nested electrode configuration where a first electrode is surrounded by a second electrode, and the first electrode is further divided into first and second portions that are surrounded by third and fourth electrodes respectively. This nested structure increases the effective capacitance area without proportionally increasing device footprint, thereby resolving the contradiction between structural simplicity and sufficient capacitance for low-voltage operation.

Inventive Principle:
Principle #7Nested doll (Nesting)

Solution Approach 2:

The patent transitions from planar electrode arrangements to three-dimensional stacked configurations with electrodes extending in multiple dimensions. The first electrode portion is positioned between second and third electrodes, while the second electrode portion is positioned between third and fourth electrodes, creating a multi-layered vertical structure that enhances capacitance through increased surface area in the vertical dimension.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Reliability

If electrode geometry is optimized to increase capacitance, then operational voltage and power consumption improve, but manufacturing complexity increases

Engineering Contradiction:
Improveoperational voltageVSAvoidfabrication process
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The patent divides the first electrode into distinct first and second portions, each surrounded by dedicated third and fourth electrodes. This segmentation allows for modular fabrication where each electrode pair can be formed and processed independently, reducing the overall manufacturing complexity despite the increased capacitance structure. The segmented design enables staged deposition and patterning processes.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent combines multiple electrode functions into a unified capacitor structure where the first electrode serves as a common reference for both first and second portions, while third and fourth electrodes provide symmetric surrounding structures. This merging of functions reduces the total number of discrete components and simplifies the interconnection scheme, thereby easing manufacturing despite the enhanced geometric complexity.

Inventive Principle:
Principle #5Merging (Combining)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration increases the capacitance of the ferroelectric capacitors, thereby improving the performance and efficiency of ferroelectric memory devices in terms of operational voltage, power consumption, and speed, making them suitable for portable and integrated circuit applications.

Implementation Method 1

Ferroelectric memory, such as ferroelectric RAM (FeRAM or FRAM), uses a ferroelectric material layer to achieve non-volatility. A ferroelectric material has a nonlinear relationship between the applied electric field and the apparent stored charge and thus, can switch polarity in an electric field.

Methodology Applied
Scientific EffectFerroelectric effect:

Data Source

PatentUS20230413576A1Ferroelectric memory device and method for forming the same
Publication Date: 2023.12.21 WUXI SMART MEMORIES TECHNOLOGIES CO LTD
  • US20230413576A1 patent drawing
  • US20230413576A1 patent drawing
  • US20230413576A1 patent drawing

AI summary

A memory device includes a plurality of memory cells. Each memory cell includes at least one transistor and at least one capacitor electrically coupled to the at least one transistor. Each capacitor includes a first electrode, a second electrode surrounding at least a first portion of the first electrode, and a ferroelectric layer disposed between the first electrode and the second electrode.