FET Package Wire-Bond Layout for Low Parasitic Inductance

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Solution Overview

Problem

Existing integrated circuit (IC) packages with field effect transistors (FETs) face challenges in managing parasitic inductance and switching noise, particularly at high switching rates, which affect performance in applications requiring high-frequency operation.

Innovation Solution

The IC package design incorporates a matrix of interleaving source and drain pads with drain and source wire bonds that form partial antiparallel loops, reducing parasitic inductance by configuring the wire bonds to avoid direct contact with the die, thereby forming a loop that minimizes parasitic inductance and switching noise.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Object-affected harmful factors

If conventional wire bond configurations are used to connect FET pads to interconnect platforms, then the structure is simple and easy to manufacture, but parasitic inductance increases and switching noise worsens at high frequencies

Engineering Contradiction:
Improveparasitic inductanceVSAvoidwire bond configuration complexity
Core Design Contradiction:
Object-affected harmful factorsVSDevice complexity

Solution Approach 1:

The wire bond configuration is segmented into multiple sections: a first wire bond section connecting the first pad to the first platform, and a second wire bond section connecting the second pad to the second platform. This segmentation allows each section to be optimized independently for minimal inductance, with sections arranged in a coplanar configuration rather than a single continuous bond, thereby reducing overall parasitic inductance while maintaining manufacturing feasibility.

Inventive Principle:
Principle #1Segmentation

2Productivity

If high switching rates are used to improve performance, then operational efficiency increases, but switching noise increases and parasitic inductance effects worsen

Engineering Contradiction:
Improveswitching rateVSAvoidswitching noise
Core Design Contradiction:
ProductivityVSObject-generated harmful factors

Solution Approach 1:

The patent converts the harmful effect of high switching rates generating noise into a benefit by designing a wire bond configuration that is inherently noise-resistant. The coplanar arrangement of wire bond sections with optimized spacing and geometry transforms the high-frequency signal path into one that minimizes electromagnetic interference and radiated noise, allowing high switching rates to be maintained without proportionally increasing switching noise.

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

Data Source

PatentUS12581980B2IC package with field effect transistor
Publication Date: 2026.03.17 TEXAS INSTRUMENTS INC
  • US12581980B2 patent drawing
  • US12581980B2 patent drawing
  • US12581980B2 patent drawing

AI summary

An IC package includes an interconnect having a first platform and a second platform that are spaced apart. The IC package includes a die superposing a portion of the first platform of the interconnect. The die has a field effect transistor (FET), and a matrix of pads for the FET situated on a surface of the die. The matrix of pads having a row of source pads and a row of drain pads. A drain wire bond extends from a first drain pad to a second drain pad of the row of drain pads and to the first platform of the interconnect. A source wire bond extends from a first source pad to a second source pad of the row of source pads, back over the first source pad and is coupled to a connection region of the first platform.