Reference Image Correction for Fiber Optic Electron Microscope Artifacts
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Solution Overview
Problem
Electron microscopes using fiber-optic bundles suffer from imaging artifacts due to distortions, which existing methods fail to accurately correct, affecting image quality and precision in applications like electron holography and membrane segmentation.
Innovation Solution
A method involving the creation of reference images using a stripe or dot pattern of uniform spatial frequency, recorded at specific angles and illuminated with visible light, is used to correct distortions in fiber-optic coupled imaging devices by capturing and compensating for distortions, allowing for precise correction of subsequent images.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If fiber-optic bundles are used to connect scintillator to charge coupled device, then image sensitivity and detection capability are improved, but imaging artifacts and distortions are introduced
Solution Approach 1:
The patent applies preliminary action by capturing distortion information from the fiber-optic bundle before actual imaging. A reference image is acquired using a uniform test pattern, and distortion correction data is extracted and stored in advance. This preliminary correction map is then applied to subsequent images, eliminating the need for real-time correction during imaging and maintaining high sensitivity while removing artifacts.
2Manufacturing precision
If distortion correction is applied to images, then image quality is improved, but correction accuracy is limited by aliased frequencies
Solution Approach 1:
The patent applies local quality by using a uniform test pattern with specific spatial frequency characteristics that optimize the local extraction of distortion information. The uniform pattern ensures that distortion effects are captured without being contaminated by aliased frequencies from complex structures. This localized optimization of the test pattern quality enables accurate distortion measurement that can be applied globally to correct images.
3Measurement precision
If stripe or dot pattern of uniform spatial frequency is used for reference image, then distortion information is isolated from aliased frequencies, but pattern fabrication complexity increases
Solution Approach 1:
The patent applies parameter changes by carefully selecting the spatial frequency parameter of the test pattern to be between 0.25 and 0.5 of the imaging device pixel resolution. This specific frequency range optimizes the separation of distortion information from aliased frequencies. By changing this critical parameter to an optimal value, the patent achieves high measurement precision while maintaining practical manufacturability of the test pattern.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach effectively corrects distortions in two dimensions, enhancing image quality and precision by isolating distortion information from aliased frequencies, enabling accurate phase reconstruction and improved resolution in electron microscopy applications.
Implementation Method 1
an electron-sensitive phosphor onto the fiber-optic plate
Implementation Method 2
a scintillator has been mounted onto the fused fiber-optic plate
Data Source
AI summary
Methods for creating reference images of fiber optic sensor plates for use in electron microscopes. The methods include taking of reference images of stripe or dot patterns. The spatial frequency of the stripe or dot patterns is such that image artifacts of the fiber optic stacks is recorded. The reference images can then be used to correct for these artifacts.