Field Device Measurement Uncertainty Determination
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Solution Overview
Problem
Existing methods for determining measurement uncertainty in field devices are inaccurate due to incomplete knowledge of independent variables, which are influenced by various factors including production, application, and environmental conditions, making it challenging to specify measurement errors precisely.
Innovation Solution
A computer-implemented method that creates a set of calculation parameters by combining standard, device-specific, and application-specific parameters, allowing for a comprehensive and continuous update of relevant independent variables to accurately determine measurement uncertainty, using a modular mathematical model that incorporates sensitivity coefficients and probabilistic distribution functions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If existing methods for determining measurement uncertainty are used, then the determination process can be completed, but the accuracy of measurement uncertainty is insufficient due to incomplete knowledge of independent variables
Solution Approach 1:
The patent applies preliminary action by creating and maintaining a comprehensive set of calculation parameters that includes standard parameters, device-specific parameters, and application-specific parameters before the measurement uncertainty determination is needed. This pre-prepared parameter set ensures that all relevant independent variables are available when required, eliminating the information completeness issue without delaying the measurement uncertainty calculation.
2Measurement precision
If a comprehensive set of independent variables is considered to improve measurement uncertainty accuracy, then measurement precision improves, but the complexity of the determination process increases
Solution Approach 1:
The patent segments the calculation parameters into three distinct categories: standard parameters (common to all measurements), device-specific parameters (unique to each field device), and application-specific parameters (specific to each measurement application). This segmentation allows the system to manage comprehensive parameter information in an organized manner, making the determination process more manageable despite the increased number of variables.
Solution Approach 2:
The patent creates a universal parameter set that serves multiple functions: it provides the basis for calculating measurement uncertainty, stores device-specific characteristics, and accommodates application-specific conditions. This multi-functional parameter structure reduces the need for separate systems for different purposes, thereby managing complexity while maintaining comprehensive coverage of all relevant variables.
3Adaptability or versatility
If measurement uncertainty is determined based on fixed parameters, then the determination is simple, but adaptability to changing conditions is insufficient
Solution Approach 1:
The patent implements dynamics by making the calculation parameters updateable and adaptable to changing conditions. The parameter set can be modified based on actual measurement conditions, device characteristics, and application requirements, allowing the system to adapt to varying operational environments while maintaining a structured approach to parameter management that controls complexity.
Data Source
AI summary
The present disclosure relates to a computer-implemented method for determining at least one measurement uncertainty for at least one measured value of a field device, in which a set of calculation parameters is created that contains at least all standard parameters of a set of standard parameters in the form of a respectively corresponding calculation parameter, and the at least one measurement uncertainty and/or a measurement uncertainty budget is calculated and/or specified based upon at least one calculation parameter value of at least one calculation parameter. Each standard parameter of the set of standard parameters comprising at least one standard parameter represents an independent variable causing the measurement uncertainty. To each calculation parameter is assigned at least one calculation parameter value in the form of at least one standard parameter value, one device parameter value, and/or one application parameter value.