Filling Machine CIP Cleaning Verification Using Conductivity Probe

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Solution Overview

Problem

Existing CIP cleaning methods for filling machines do not provide a reliable verification of whether all filling elements have been properly cleaned, leading to potential contamination and hygiene issues.

Innovation Solution

The method involves using an electric filling level probe to detect the presence of a cleaning medium in the rinsing chamber, ensuring that each filling element is cleaned by measuring the electrical conductivity and verifying the presence of the cleaning medium, which is then recorded for complete machine verification.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If CIP cleaning is performed without verification, then cleaning process is simple and quick, but cleaning effectiveness cannot be proven leading to potential contamination

Engineering Contradiction:
Improvecleaning verificationVSAvoidcleaning system
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The electrical fill level probe provides feedback by detecting the presence of cleaning medium through electrical conductivity changes. When cleaning medium enters the rinsing chamber, it closes the electrical circuit of the probe, generating a signal that confirms cleaning medium presence. This feedback mechanism verifies cleaning effectiveness without adding complex verification systems.

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The electrical fill level probe acts as an intermediary element that indirectly detects cleaning medium presence. Instead of directly monitoring the cleaning process, the probe uses the electrical conductivity of the cleaning medium to close its circuit, providing verification through this intermediary measurement mechanism.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Reliability

If additional verification components are added to CIP cleaning, then cleaning verification is improved, but device complexity and cost increase

Engineering Contradiction:
Improvecleaning verificationVSAvoidcleaning system
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The electrical fill level probe serves multiple functions: it monitors liquid levels during normal filling operations and detects cleaning medium presence during CIP cleaning. By utilizing this existing component for dual purposes, the system achieves verification capability without adding dedicated verification hardware.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The cleaning verification system uses the probe's own electrical circuit closure as the verification mechanism. The cleaning medium itself closes the probe's circuit, and this same action serves as the verification signal, eliminating the need for separate verification sensors or additional components.

Inventive Principle:
Principle #25Self-service

3Reliability

If electrical fill level probe is used for cleaning verification, then cleaning proof is achieved, but measurement precision requirements increase

Engineering Contradiction:
Improvecleaning verificationVSAvoidconductivity detection
Core Design Contradiction:
ReliabilityVSMeasurement precision

Solution Approach 1:

The system monitors changes in electrical conductivity parameters of the medium in the rinsing chamber. When cleaning medium (with different conductivity than air or product) enters the chamber, it changes the electrical state of the probe circuit, providing verification through this parameter change rather than requiring absolute precision measurements.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach ensures that all filling elements are thoroughly cleaned and the machine is completely sanitized, reducing the risk of contamination and providing proof of effective cleaning without requiring additional components or complex mechanisms.

Implementation Method 1

at least one measurement is performed with the electrical fill level probe during CIP cleaning. The cleaning medium closes a circuit of the electrical fill level probe, thus detecting the presence of cleaning medium in the cleaning chamber

Methodology Applied
Scientific EffectElectrical conductivity: Conduction (electrical)

Data Source

PatentEP3959167B1Method for the cip-cleaning of a filling machine and filling machine
Publication Date: 2023.01.18 KHS GMBH
  • EP3959167B1 patent drawingFigure 1a
  • EP3959167B1 patent drawingFigure 1b
  • EP3959167B1 patent drawingFigure 2

AI summary

The invention relates to a method for the CIP cleaning of at least one filling element (1) of a filling machine for filling containers with liquid contents, wherein the filling machine has a multiplicity of filling positions on a circulating transporting element, wherein each filling position has a filling element (1) with a filling valve (2) and an electric filling-level probe (7), and ,for the CIP cleaning operation, the filling valve (2) and the electric filling-level probe (7) are accommodated in a flushing chamber (13), which is provided by a closure element (12), in particular a flushing cap or flushing sleeve, and at least one cleaning medium is directed into the flushing chamber (13). The method is distinguished in particular in that, during the CIP cleaning operation, at least one measurement is carried out using the electric filling-level probe (7). The invention also relates to a filling machine which is intended for filling containers with liquid contents and has a control means designed to implement the method according to the description above.