Film Thickness Measurement Through Source-Block Height Difference

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Solution Overview

Problem

Existing methods for determining the thickness of films or sheets directly on the article of manufacture lead to increased space requirements, instability during measurement, and require recalibration for different thicknesses, making the process less flexible and slower.

Innovation Solution

Measure the thickness of the film or sheet indirectly by measuring the source material before and after cutting, using a measurement device to calculate the difference in source-material height, eliminating the need for direct measurement on the article of manufacture.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If direct measurement on the article of manufacture is used, then measurement accuracy can be achieved, but space requirements increase and measurement stability decreases

Engineering Contradiction:
Improvethickness measurement accuracyVSAvoidspace requirements
Core Design Contradiction:
Measurement precisionVSArea of stationary object

Solution Approach 1:

The patent uses the source material as an intermediary measurement object. Instead of measuring the thin film or sheet directly, the system measures the thickness of the source material block before and after cutting, then calculates the film thickness as the difference. This intermediary approach allows accurate thickness determination without requiring specialized measurement space for the final product.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent inverts the measurement approach by measuring the source material rather than the product. Conventional methods measure the film or sheet directly; this patent measures the block material from which the film is cut, reversing the measurement target to achieve the same information with different spatial requirements.

Inventive Principle:
Principle #13The other way round (Inversion)

2Measurement precision

If direct measurement on the article of manufacture is used, then thickness can be determined, but measurement stability decreases due to instability during measurement

Engineering Contradiction:
Improvethickness measurement accuracyVSAvoidmeasurement stability
Core Design Contradiction:
Measurement precisionVSStability of the object's composition

Solution Approach 1:

The source material serves as a stable intermediary that remains stationary during measurement. The thick block material provides mechanical stability and can be measured without the handling and positioning issues that plague thin film measurements, thereby improving measurement stability while maintaining accuracy through differential calculation.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent performs measurement of the source material before the cutting operation. By measuring the source material in its stable, intact state before it is cut into thin films, the system captures thickness information when the object is most stable and easiest to measure accurately.

Inventive Principle:
Principle #10Preliminary action

3Measurement precision

If direct measurement on the article of manufacture is used, then thickness can be determined, but recalibration is required for different thicknesses, reducing flexibility and productivity

Engineering Contradiction:
Improvethickness measurement accuracyVSAvoidadjustment speed
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The measurement system is designed to measure the source material block in a universal manner that does not depend on the final product thickness. The same measurement setup and calibration can be used regardless of what thickness of film will ultimately be produced, as the system measures the block material properties rather than the finished product properties.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The patent changes the measurement parameter from direct film thickness to source material thickness difference. This parameter transformation allows the system to maintain consistent measurement conditions and calibration across different production runs, as the source material properties remain relatively constant while the desired film thickness varies.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS12416489B2Method for measuring a thickness of a film or plate, system for manufacturing a film or plate of this type, and method for operating a system of this type
Publication Date: 2025.09.16 ALBRECHT BAUMER KG SPEZIALMASCHINENFABRIK
  • US12416489B2 patent drawing
  • US12416489B2 patent drawing
  • US12416489B2 patent drawing

AI summary

The invention relates to a method for measuring a thickness (d) of a film (90′) or sheet (90), wherein the film (90′) or sheet (90) is cut as an article of manufacture made from a block material intended as a source material (80), in particular, from a block of foam. The source material has a source-material length (81, 85) extending in the longitudinal direction (x; x′), a source-material width extending in the latitudinal direction (y) (82, 86) and a source-material height extending in the vertical direction (z) (83, 87). In this method, the source material is conveyed along the longitudinal direction (x; x′) to a cutting unit (50) in order to cut the source material. The cutting unit (50) cuts the film (90′) or sheet (90) out of the source material along the longitudinal direction (x; x′). In addition, in order to determine the thickness (d) of the film (90′) or sheet (90), the thickness (d) along the vertical direction (z) is determined. Furthermore, the invention relates to a system for manufacturing a film (90′) or sheet (90), as well as a method for operating such a system.