Fin and Mesa Transistor Integration Across Mixed Voltage Nodes
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Solution Overview
Problem
Existing technologies struggle to integrate multiple types of transistors, such as core, low-voltage, medium-voltage, and high-voltage transistors, on a single semiconductor substrate, as FinFETs are not suitable for medium- and high-voltage applications.
Innovation Solution
The integration process forms semiconductor fins for core and low-voltage transistors, and mesa structures for medium- and high-voltage transistors on a shared substrate, using dielectric plugs or polysilicon plugs in the gates of medium- and high-voltage transistors, and forming dummy strips on Shallow Trench Isolation regions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Speed
If FinFETs are used for core and low-voltage transistors, then device performance and speed are improved, but they cannot be used for medium- and high-voltage transistors
Solution Approach 1:
The substrate is divided into multiple device regions (first device region for FinFETs, second device region for planar transistors) where each region is optimized for specific voltage requirements. FinFETs are used in the first region for core and low-voltage applications, while planar transistors are used in the second region for medium- and high-voltage applications, allowing each transistor type to operate in its optimal voltage range
Solution Approach 2:
Different transistor structures are implemented in different spatial locations on the same substrate. The first device region contains FinFETs with vertically oriented channels optimized for high performance at low voltage, while the second device region contains planar transistors with laterally oriented channels optimized for high voltage operation, giving each region locally optimized properties for its intended function
2Adaptability or versatility
If multiple types of transistors are integrated on a single substrate, then circuit functionality is improved, but manufacturing complexity increases
Solution Approach 1:
A unified manufacturing process is developed that can produce both FinFETs and planar transistors using the same fabrication steps and equipment. The process includes forming both vertically oriented FinFET structures and laterally oriented planar transistor structures through common process modules, reducing the need for separate manufacturing lines and simplifying production
Solution Approach 2:
The manufacturing processes for FinFETs and planar transistors are merged into a single integrated fabrication sequence. Common process steps such as substrate preparation, isolation formation, doping, and metallization are combined and executed in a unified manner, allowing both transistor types to be manufactured simultaneously on the same substrate through a single process flow
3Ease of manufacture
If FinFETs are used exclusively, then manufacturing simplicity is maintained, but medium- and high-voltage transistor requirements cannot be met
Solution Approach 1:
The substrate is divided into multiple device regions (first device region for FinFETs, second device region for planar transistors) where each region is optimized for specific voltage requirements. FinFETs are used in the first region for core and low-voltage applications, while planar transistors are used in the second region for medium- and high-voltage applications, allowing each transistor type to operate in its optimal voltage range
Solution Approach 2:
A unified manufacturing process is developed that can produce both FinFETs and planar transistors using the same fabrication steps and equipment. The process includes forming both vertically oriented FinFET structures and laterally oriented planar transistor structures through common process modules, reducing the need for separate manufacturing lines and simplifying production
Data Source
AI summary
A structure includes a bulk semiconductor substrate, a first plurality of dielectric isolation regions over the bulk semiconductor substrate, a plurality of semiconductor fins protruding higher than the first plurality of dielectric isolation regions, a first gate stack on top surfaces and sidewalls of the plurality of semiconductor fins, a second plurality of dielectric isolation regions over the bulk semiconductor substrate, a mesa structure in the second plurality of dielectric isolation regions, and a second gate stack over the mesa structure. Top surfaces of the first gate stack and the second gate stack are coplanar with each other.


