Opto-Mechanical Fine Dust Analyzer With Movable Optical Reference
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Solution Overview
Problem
Existing analytical instruments for measuring fine particulate matter (PM1.5) face challenges due to high temperatures of sample gases, requiring regular maintenance and inspection, and there is a need for a device that can easily check for correct function.
Innovation Solution
An opto-mechanical analysis device with a displacement unit and optical reference measuring element that moves between parked and reference positions, allowing for continuous verification of measurement accuracy by comparing reference measurement data, and includes features like a protective housing and optical attenuator to prevent contamination and damage.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If the analytical instrument is exposed to high temperature sample gas for continuous measurement, then the measurement capability is maintained, but the device requires regular maintenance and inspection due to thermal damage and contamination
Solution Approach 1:
The optical reference measuring element is extracted from the high-temperature measurement environment and placed in a protected reference position where it is not exposed to hot sample gas. This allows the measurement function to be separated from the harsh thermal conditions, enabling continuous measurement capability while protecting the critical optical component from thermal damage and contamination.
Solution Approach 2:
The optical reference measuring element is made movable between a measurement position (exposed to sample gas) and a reference position (protected from hot gas). This dynamic positioning allows the system to switch between measurement mode and reference verification mode, maintaining continuous measurement capability while periodically protecting the optical element from thermal damage.
2Measurement precision
If the optical reference measuring element is placed in the measuring chamber for accuracy verification, then measurement accuracy can be checked, but the optical element is exposed to high temperatures and contamination
Solution Approach 1:
The sealing cover is positioned to close the measuring chamber inlet before the optical reference measuring element is fully inserted into the reference position. This preliminary sealing action prevents hot sample gas from contaminating the optical element during the verification process, allowing accurate reference measurements without exposing the optical component to harmful thermal and particulate conditions.
Solution Approach 2:
The sealing cover acts as an intermediary barrier between the hot sample gas in the measuring chamber and the optical reference measuring element. By closing the chamber inlet during reference verification, the sealing cover mediates the interaction between these two elements, allowing accuracy verification while protecting the optical element from thermal damage and contamination.
3Reliability
If the measuring chamber is sealed during reference measurement, then the optical element is protected from contamination, but the device complexity increases
Solution Approach 1:
The sealing cover is combined with the displacement unit that moves the optical reference measuring element between positions. This merging of functions allows the chamber to be sealed during reference measurement without requiring a separate sealing mechanism, thereby protecting the optical element while minimizing the increase in device complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Ensures continuous monitoring of measurement accuracy by detecting deviations in reference data, preventing contamination of the optical element, and protecting it from high temperatures, thereby maintaining device functionality.
Implementation Method 1
at least one first light source (4a, 4b, 4c) configured to generate a first light with a first wavelength... detectors (8) designed to receive scattered light which is created when the first light hits the fine dust (2)
Implementation Method 2
the first light can be directed onto the optical reference measuring element (10) in the reference measuring position, and wherein the plurality of detectors (8) are configured to receive the scattered light from the optical reference measuring element (10)
Data Source
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AI summary
An opto-mechanical analysis device (1) for determining particulate matter (2) in a measurement gas (3) comprises a first light source (4a), a measuring chamber (7), a plurality of detectors (8), a control device (9), an optical reference measuring element (10), and a displacement unit (11). A first light from the first light source (4a) can be coupled into the measuring chamber (7). The detectors (8) are designed to receive scattered light that arises when the first light strikes the particulate matter (2) and to generate scattered light measurement data and transmit them to the control device (9). The displacement unit (11) is designed to displace the optical reference measuring element (10) from a parked position to a reference measuring position, wherein the first light can be irradiated into the optical reference measuring element (10) in the reference measuring position.The detectors (8) are designed to receive scattered light from the optical reference measuring element (10) in the reference measuring position and to generate reference measurement data and to transmit them to the control device (9).