Fine Particle Measuring Apparatus Self-Calibration
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Solution Overview
Problem
Current fine particle measuring apparatuses, such as flow cytometers, face complexity in correcting measurement errors due to nonlinearity in the optical system and sensitivity differences among light-receiving elements, requiring frequent calibration with standard samples.
Innovation Solution
A fine particle measuring apparatus that includes a detection unit and a processing unit capable of calculating corrected intensity values by dividing fluorescence intensity by detection wavelength bandwidth and relative sensitivity of each light-receiving element, generating spectrum data, and comparing it with reference data to compensate for measurement errors without the need for standard sample measurement.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional calibration methods using standard samples are employed to correct measurement errors, then measurement precision is improved, but device complexity and operational complexity increase due to frequent calibration requirements
Solution Approach 1:
The system performs self-calibration by automatically detecting and correcting nonlinearity errors using built-in reference signals and algorithms, eliminating the need for external standard samples and manual calibration operations. The apparatus serves itself to maintain measurement accuracy without requiring operator intervention or additional calibration materials.
Solution Approach 2:
The system pre-stores calibration data and correction parameters in memory during manufacturing or initial setup. These preliminary calibration results are then reused during normal operation to correct measurement errors, avoiding the need for frequent recalibration with standard samples and reducing operational complexity.
2Measurement precision
If conventional calibration methods using standard samples are employed to correct measurement errors, then measurement precision is improved, but loss of time increases due to frequent calibration measurements
Solution Approach 1:
Calibration data and correction parameters are pre-acquired and stored in memory during manufacturing or initial setup. During normal measurement operations, the system retrieves and applies these pre-stored calibration parameters instantaneously, eliminating the time-consuming process of measuring standard samples before each analysis session.
Solution Approach 2:
The system automatically performs rapid self-calibration using built-in reference signals embedded in the measurement path, correcting nonlinearity errors in real-time without requiring external standard samples or operator intervention, thus minimizing time loss while maintaining measurement precision.
3Measurement precision
If correction based on detection wavelength bandwidth and relative sensitivity is applied, then measurement precision is improved by compensating optical system nonlinearity, but device complexity increases due to additional correction processing
Solution Approach 1:
The system replaces complex physical calibration mechanisms with computational correction methods. By using software algorithms to calculate and apply correction factors based on detection wavelength bandwidth and relative sensitivity characteristics, the system achieves high measurement precision without adding mechanical complexity or requiring additional physical calibration components.
Solution Approach 2:
The system dynamically adjusts measurement parameters and correction factors based on the specific detection wavelength and sensitivity characteristics of each light-receiving element. By changing and optimizing these parameters computationally, the system compensates for optical nonlinearity and achieves high precision without requiring complex physical modifications to the optical system.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach allows for accurate analysis of fine particles by correcting measurement errors caused by optical system nonlinearity and sensitivity differences, reducing the complexity of calibration and enabling precise analysis without the need for standard sample measurement in each analysis.
Implementation Method 1
detects fluorescence or scattering light emitted from the fine particles
Implementation Method 2
light-receiving element such as a photo multiplier tube (PMT)
Data Source
AI summary
A fine particle measuring apparatus is provided. The fine particle measuring apparatus includes a detection unit configured to detect light emitted from a fine particle and a processing unit having a memory device storing instructions which when executed by the processing unit, cause the processing unit to calculate a corrected intensity value of the detected light and generate spectrum data based on the corrected intensity value.