FinFET Work Function Layer Etching With an Adhesion Barrier

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Solution Overview

Problem

Existing FinFET technologies face issues with accurate control of threshold voltages due to etchants penetrating through the interface between the hardmask layer and patternable layer, leading to undesired loss of work function layers and inconsistent threshold voltages.

Innovation Solution

Incorporating an adhesion layer with organic acid functionality to enhance bonding between the hardmask layer and patternable layer, preventing etchant penetration and allowing for precise etching of work function layers to achieve controlled threshold voltages.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If a hardmask layer and patternable layer are used in FinFET fabrication, then etching precision is improved, but etchants penetrate through the interface between layers causing loss of work function layers and inconsistent threshold voltages

Engineering Contradiction:
Improveetching precisionVSAvoidthreshold voltage consistency
Core Design Contradiction:
Manufacturing precisionVSReliability

Solution Approach 1:

An adhesion layer is introduced as an intermediary between the hardmask layer and the patternable layer. This adhesion layer serves as a mediator that prevents etchant penetration through the layer interface, thereby protecting the work function layers from unintended removal while maintaining the etching precision provided by the hardmask and patternable layers. The adhesion layer acts as a barrier that mediates the interaction between etchants and the underlying work function layers.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent employs a composite multi-layer structure consisting of the hardmask layer, adhesion layer, and patternable layer. This composite material approach creates a more robust interface that resists etchant penetration. The combination of different materials with complementary properties (etch resistance, adhesion, and barrier characteristics) solves the problem of etchant penetration while maintaining manufacturing precision.

Inventive Principle:
Principle #40Composite materials

2Manufacturing precision

If work function layers are etched to control threshold voltages, then threshold voltage control is improved, but etchants penetrate through the patternable layer causing undesired loss of work function layers

Engineering Contradiction:
Improvethreshold voltage controlVSAvoidwork function layer loss
Core Design Contradiction:
Manufacturing precisionVSLoss of substance

Solution Approach 1:

The adhesion layer serves as a protective intermediary between the patternable layer and the work function layers. During etching processes, this adhesion layer acts as a selective barrier that allows controlled etching of work function layers for threshold voltage adjustment while preventing unintended penetration through the patternable layer that would cause undesired loss of work function layers.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The adhesion layer is deposited beforehand to create a protective cushion or barrier over the work function layers. This pre-established protective layer prevents etchants from penetrating through the patternable layer and causing undesired loss of work function layers, while still allowing controlled etching where needed for threshold voltage control.

Inventive Principle:
Principle #11Beforehand cushioning (Prior cushioning)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The adhesion layer effectively prevents etchant penetration, enabling accurate control of threshold voltages for FinFETs by ensuring the integrity of work function layers during etching processes.

Implementation Method 1

The adhesion layer comprises an organic acid that concurrently bonds metal atoms of the hardmask layer and phenol groups of the patternable layer

Methodology Applied
Scientific EffectChemical bonding: Chemical Bonding

Data Source

PatentUS20250301765A1Fin field-effect transistor and method of forming the same
Publication Date: 2025.09.25 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US20250301765A1 patent drawing
  • US20250301765A1 patent drawing
  • US20250301765A1 patent drawing

AI summary

A method for manufacturing a semiconductor device includes forming one or more work function layers over a semiconductor structure. The method includes forming a hardmask layer over the one or more work function layers. The method includes forming an adhesion layer over the hardmask layer. The method includes removing a first portion of a patternable layer that is disposed over the hardmask layer. The adhesion layer comprises an organic acid that concurrently bonds metal atoms of the hardmask layer and phenol groups of the patternable layer, thereby preventing an etchant from penetrating into a second portion of the patternable layer that still remains over the hardmask layer.