FinFET and Nanostructure FET Integration on Single Substrate

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Solution Overview

Problem

Current integrated circuits using FinFETs and nanowire FETs on different substrates occupy more space and have limited current capacity due to the use of single nanostructures per stack, which restricts their performance in compact devices.

Innovation Solution

Integrating FinFETs and nanostructure FETs on a single bulk substrate, where the nanostructure FETs include multiple nanostructures per stack, increasing current capacity and reducing space requirements by forming a stack of at least two nanostructures between source and drain regions.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If FinFETs and nanowire FETs are formed on different substrates, then device functionality is achieved, but space occupation increases

Engineering Contradiction:
Improvedevice functionalityVSAvoidspace occupation
Core Design Contradiction:
Adaptability or versatilityVSArea of stationary object

Solution Approach 1:

The patent merges FinFET and nanowire FET fabrication processes onto a single substrate by forming nanowire stacks in trenches adjacent to FinFET structures. This integration allows both transistor types to coexist on the same substrate, reducing the total area required compared to using separate substrates while maintaining the functional advantages of both device types.

Inventive Principle:
Principle #5Merging (Combining)

2Ease of manufacture

If a single nanowire per nanowire stack is used, then fabrication simplicity is maintained, but current capacity is limited

Engineering Contradiction:
Improvefabrication simplicityVSAvoidcurrent capacity
Core Design Contradiction:
Ease of manufactureVSQuantity of substance

Solution Approach 1:

The patent segments the current conduction path by creating multiple discrete nanowires within each nanowire stack. Instead of relying on a single nanowire, the structure divides the channel into multiple parallel nanowires (e.g., three nanowires per stack), which collectively provide higher current capacity while maintaining a relatively simple fabrication process using sequential epitaxial growth and selective removal.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent transitions from a two-dimensional planar view to a three-dimensional vertical structure by forming nanowire stacks that extend vertically within trenches. This vertical stacking allows multiple nanowires to be packed into a compact footprint, increasing current capacity without proportionally increasing the lateral area occupied.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Quantity of substance

If multiple nanostructures per nanostructure stack are implemented, then current capacity increases, but device complexity increases

Engineering Contradiction:
Improvecurrent capacityVSAvoiddevice complexity
Core Design Contradiction:
Quantity of substanceVSDevice complexity

Solution Approach 1:

The patent applies preliminary action by pre-forming alternatingbilayer structures with suspended sections before final device completion. The alternatingbilayer epitaxial growth creates precursor structures that are subsequently processed to form the multi-nanowire stacks. This preliminary structuring simplifies the overall fabrication sequence despite the complexity of the final multi-nanowire configuration.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS10439039B2Integrated circuits including a FinFET and a nanostructure FET
Publication Date: 2019.10.08 QUALCOMM INC
  • US10439039B2 patent drawing
  • US10439039B2 patent drawing
  • US10439039B2 patent drawing

AI summary

An integrated circuit includes a FinFET and a nanostructure FET. The integrated circuit includes a bulk substrate. The integrated circuit also includes a fin field effect transistor (FinFET) coupled to the bulk substrate. The FinFET includes a first source region, a first drain region, and a fin extending between the first source region and the first drain region. The integrated circuit also includes a nanostructure FET coupled to the bulk substrate. The nanostructure FET includes a second source region, a second drain region, and a stack of at least two nanostructures extending between the second source region and the second drain region.