FinFET Source-Sharing Layout for Narrow Pitch and Matching

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Solution Overview

Problem

Existing semiconductor devices with fin field effect transistors (FinFETs) face challenges in achieving a narrow pitch width and excellent matching between transistors due to the shadow effect of ion injection and process impacts, leading to poor current flow alignment and increased pitch width.

Innovation Solution

The semiconductor device is designed with first and second transistors connected in parallel, sharing a source and having fin activation layers arranged adjacent to each other, with gate electrodes formed via an insulating film between drain and source layers, and dummy layers to maintain structure, allowing for opposite current flow directions between transistors to cancel each other out and reduce process impacts.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If transistors are arranged with conventional source sharing configuration, then manufacturing process is simplified, but pitch width increases and matching between transistors deteriorates due to shadow effect of ion injection

Engineering Contradiction:
Improvemanufacturing process simplicityVSAvoidtransistor matching precision
Core Design Contradiction:
Ease of manufactureVSManufacturing precision

Solution Approach 1:

The patent inverts the conventional current flow direction arrangement between adjacent transistors. Instead of having currents flow in the same direction, the invention configures adjacent transistors to have opposite current flow directions, which eliminates the shadow effect of ion injection and improves transistor matching precision while maintaining reasonable pitch width

Inventive Principle:
Principle #13The other way round (Inversion)

2Productivity

If pitch width between transistors is reduced, then device integration density improves, but process impacts and shadow effect of ion injection increase leading to poor transistor matching

Engineering Contradiction:
Improvedevice integration densityVSAvoidtransistor matching precision
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The patent converts the harmful shadow effect of ion injection into a beneficial configuration by deliberately arranging current flows in opposite directions. This configuration causes the shadow effects to cancel each other out, allowing narrow pitch width to be achieved without sacrificing transistor matching precision

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

3Ease of operation

If conventional transistor configuration is used, then current flow alignment is simpler, but pitch width increases and device area expands

Engineering Contradiction:
Improvecurrent flow alignment simplicityVSAvoiddevice area
Core Design Contradiction:
Ease of operationVSArea of stationary object

Solution Approach 1:

The patent inverts the conventional approach by configuring adjacent transistors with opposite current flow directions. This not only reduces pitch width and device area but also maintains current flow alignment through systematic opposite-direction configuration of source and drain connections

Inventive Principle:
Principle #13The other way round (Inversion)

Data Source

PatentEP2101353B1Semiconductor device
Publication Date: 2024.02.28 SONY GROUP CORP
  • EP2101353B1 patent drawingFigure 1
  • EP2101353B1 patent drawingFigure 2A~2B
  • EP2101353B1 patent drawingFigure 3~4

AI summary

Disclosed herein is a semiconductor device including: first and second transistors, each of the first and second transistors being formed with a plurality of fin transistors, and the first and second transistors being connected in parallel to electrically share a source, wherein the plurality of fin transistors each include a fin activation layer, the fin activation layer protruding from a semiconductor substrate, a source layer serving as the source being formed on one end, and a drain layer on the other end of the fin activation layer so as to form a channel region, the fin activation layers are arranged adjacent to each other in parallel, and the drain layers are disposed so that the currents flow through the plurality of fin transistors in opposite directions between the first and second transistors.