Five-Dimensional Electron Microscopy With Delayed Pulse Imaging

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Solution Overview

Problem

Current electron microscopes, such as the four-dimensional ultrafast electron microscope (UEM), are unable to implement and analyze five-dimensional imaging and characterization methods, which include spatial and temporal data combined with electron energy information.

Innovation Solution

A five-dimensional electron microscope system that uses a photocathode irradiated with first laser pulses to generate electron pulses, which are then delayed and used to excite a sample along with second laser pulses, detected by a pixel camera, and processed to analyze the sample's five-dimensional information.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Speed

If conventional electron microscopes are used, then high spatial resolution can be maintained, but temporal resolution is restricted to millisecond or more

Engineering Contradiction:
Improvetemporal resolutionVSAvoidtime restriction
Core Design Contradiction:
SpeedVSLoss of time

Solution Approach 1:

The patent employs periodic laser pulses to generate electron pulses at controlled intervals, enabling ultrafast temporal resolution. The laser pulses periodically excite the photocathode to produce synchronized electron pulses that can probe dynamic processes in the sample with femtosecond to picosecond precision, overcoming the millisecond limitation of conventional continuous electron beams.

Inventive Principle:
Principle #19Periodic action

Solution Approach 2:

The system dynamically controls the electron beam by using pulsed electron generation from a photocathode instead of continuous emission. The electron pulses are temporally synchronized with laser pulses to probe transient states, enabling dynamic observation of ultrafast processes while maintaining spatial resolution through precise beam control.

Inventive Principle:
Principle #15Dynamics

2Measurement precision

If single electron imaging is used, then high spatial resolution is provided, but signal-to-noise ratio is reduced

Engineering Contradiction:
Improvespatial resolutionVSAvoidsignal-to-noise ratio
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The patent accumulates multiple electron pulse signals continuously to improve signal-to-noise ratio while maintaining spatial resolution. By repeatedly irradiating the sample with electron pulses and accumulating the detected signals, the system enhances the reliability of measurements without sacrificing the high spatial resolution capability of single electron imaging.

Inventive Principle:
Principle #20Continuity of useful action

3Measurement precision

If five-dimensional imaging is implemented, then ultrafast temporal and high spatial resolution are achieved, but device complexity increases

Engineering Contradiction:
Improvefive-dimensional informationVSAvoidsystem complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent uses a pixel camera that can detect both spatial position and temporal information of electron pulses, providing multi-functionality. The same detector captures five-dimensional information (three spatial dimensions plus time and energy), reducing the need for separate specialized devices and managing system complexity through a unified detection platform.

Inventive Principle:
Principle #6Universality (Multi-functionality)

4Speed

If electron pulses are delayed from laser pulses, then ultrafast temporal resolution is achieved, but synchronization complexity increases

Engineering Contradiction:
Improvetemporal resolutionVSAvoidsynchronization complexity
Core Design Contradiction:
SpeedVSDevice complexity

Solution Approach 1:

The system preliminarily establishes a fixed time delay between laser pulses and electron pulses using a delay generator. This predetermined delay is set before the measurement process, synchronizing the electron pulse arrival time with the transient state of the sample excited by the laser, thereby achieving ultrafast temporal resolution without requiring complex real-time synchronization adjustments.

Inventive Principle:
Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables imaging and analysis of five-dimensional information, providing ultrafast temporal resolution and high spatial resolution, allowing for the observation of dynamic processes in nano-materials and solid substances with improved signal-to-noise ratio and reduced noise.

Implementation Method 1

a photocathode that is irradiated with first laser pulses and generates electron pulses

Methodology Applied
Scientific EffectPhotoemission: Photoelectric Effect

Data Source

PatentUS20240395499A1Five-dimensional electron microscope and analysis method therefor
Publication Date: 2024.11.28 RIKEN CO LTD
  • US20240395499A1 patent drawing
  • US20240395499A1 patent drawing
  • US20240395499A1 patent drawing

AI summary

Since it takes time of seconds to minutes to obtain a single image, time-division observation of a sample cannot be performed for events on a time scale less than the time it takes to obtain the single image of the sample. A five-dimensional electron microscope includes: a photocathode 9 that is irradiated with first laser pulses and generates electron pulses; a sample 15 that is irradiated with the electron pulses and second laser pulses, and becomes excited; a pixel camera 18 that detects the electron pulses that have passed through the sample; and a processing unit that processes an output of the pixel camera, and the electron pulses are delayed by a delay time from the second laser pulses by a delay generator 25.