Fixture Tool Indexing With Probe-Based Position Detection
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Solution Overview
Problem
Current manufacturing methods for indexing workpieces in automated machines are time-consuming and expensive, especially for large structures like aircraft parts, and are not conducive to continuous manufacturing processes.
Innovation Solution
An indexing apparatus and method that includes a fixture tool, an indexing feature, and a plurality of probes, with a controller to locate the fixture tool relative to the operation cell from probe locations, allowing for quick and accurate indexing of the automated machine.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional probing methods are used to index workpieces, then measurement precision can be achieved, but manufacturing time and setup complexity increase significantly
Solution Approach 1:
Indexing features are pre-integrated into the fixture tool during manufacturing, eliminating the need for time-consuming probe measurements during setup. The fixture tool arrives with indexing features already in precise locations, allowing immediate positioning of the workpiece without extensive measurement and calculation procedures.
Solution Approach 2:
The indexing feature acts as an intermediary element between the fixture tool and the workpiece. Instead of directly probing the workpiece to determine its location, the system uses the indexing feature as a reference mediator that provides known geometric relationships, simplifying the positioning process and reducing setup time while maintaining precision.
2Measurement precision
If extensive probing is performed on large structures, then accurate indexing can be achieved, but device complexity and cost increase
Solution Approach 1:
The indexing system is segmented into distinct components: the fixture tool with integrated indexing features, and the probing system. The indexing features are divided into multiple known geometric elements (planes, cylinders, spheres) that can be independently referenced. This segmentation simplifies the overall system complexity by providing discrete, well-defined reference points rather than requiring complex continuous measurement procedures.
Solution Approach 2:
The indexing features serve as physical copies or replicas of ideal geometric forms directly integrated into the fixture tool. Instead of using complex measurement systems to determine workpiece location, the system uses these pre-formed geometric copies as direct references, simplifying the indexing apparatus while maintaining high accuracy through the precision of the manufactured indexing features.
3Manufacturing precision
If traditional indexing methods are used, then workpiece positioning can be achieved, but productivity and manufacturing speed decrease
Solution Approach 1:
The indexing features are prepared in advance during fixture tool manufacturing, eliminating the need for time-consuming measurement and calculation procedures during each workpiece setup. This preliminary preparation enables rapid workpiece positioning while maintaining precision, directly improving manufacturing throughput without sacrificing positioning accuracy.
Solution Approach 2:
The indexing features enable continuous workpiece positioning operations by providing persistent, pre-established reference geometries. Once the fixture tool is set up with the indexing features, multiple workpieces can be rapidly indexed using the same reference system without requiring re-measurement or re-calibration, maintaining both precision and high productivity throughout the manufacturing process.
Data Source
AI summary
An indexing apparatus includes a fixture tool, movable relative to an operation cell, and an indexing feature, fixed relative to the fixture tool. The indexing apparatus also includes a plurality of probes, configured to engage the indexing feature. The indexing apparatus further includes a controller, in communication with the plurality of probes, wherein the controller is configured to locate the fixture tool relative to the operation cell from a plurality of probe locations of the plurality of probes, engaged with the indexing feature.