Flash Memory Controller Host-Directed Test Operations
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Solution Overview
Problem
Existing Flash memory devices face inefficiencies in access control due to the need for complex special commands and frequent communication between Flash memory vendors and memory controller vendors, leading to decreased working efficiency and increased costs during Flash memory tests.
Innovation Solution
A method for performing host-directed operations in a Flash memory controller that extracts and analyzes encoded information from host commands to execute specific operations without altering the program code, allowing for direct control over Flash memory during tests and providing a flexible test platform for vendors.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If special commands are embedded in program code within the memory device to perform test operations on the Flash memory, then test functionality is provided, but the device complexity increases and communication overhead between vendors increases
Solution Approach 1:
The patent extracts the test operation functionality from the embedded program code and relocates it to the host device. Instead of having special test commands hard-coded in the memory device's program, the host device now executes test operations by sending specially formatted commands that the memory device interprets and executes. This extraction reduces the complexity of the memory device's program code while maintaining full test functionality.
Solution Approach 2:
The patent introduces an intermediary mechanism where the host device acts as a mediator between the test requirements and the Flash memory. The host device contains the test logic and communicates with the Flash memory through standardized interfaces, eliminating the need for complex embedded test commands in the Flash memory's program code. This intermediary approach simplifies the memory device while preserving adaptability.
2Reliability
If multiple special commands are provided for Flash memory testing, then comprehensive test coverage is achieved, but the number of commands increases and working efficiency decreases
Solution Approach 1:
The patent implements a universal test command structure where a single command format can perform multiple test operations by varying parameters such as address ranges, operation types, and data patterns. Instead of having separate specialized commands for each test function, the unified command structure achieves comprehensive test coverage while reducing the total number of commands and improving working efficiency.
3Adaptability or versatility
If Flash memory vendors communicate with memory controller vendors multiple times regarding special commands, then test requirements are met, but communication overhead increases and time is consumed
Solution Approach 1:
The patent applies preliminary action by having the Flash memory vendor define all test requirements and command formats in advance, which are then implemented in the host device's test software. This preliminary specification eliminates the need for iterative communication between vendors during the testing phase, as the standardized command structure is already established and can be directly implemented by different memory controller vendors without further negotiation.
4Ease of operation
If program code in the memory device is altered to provide test functionality, then direct control over Flash memory is achieved, but the ease of manufacture decreases
Solution Approach 1:
The patent uses copying by implementing test functionality in the host device's software rather than modifying the Flash memory device's program code. The host device contains a copy of the test logic that communicates with the Flash memory through standard interfaces, providing direct control functionality without requiring any alterations to the manufactured Flash memory devices. This approach maintains ease of manufacture while achieving the desired operational control.
Data Source
AI summary
A method for performing host-directed operations is provided, where the method is applied to a controller of a Flash memory that includes a plurality of blocks. The method includes: in a test mode of the controller, when receiving a host command from a host device, extracting at least one portion of associated information of the host command, where the at least one portion of the associated information is an encoded result that is generated by performing encoding on a host-directed operation command; and analyzing the at least one portion of the associated information according to at least one predetermined rule, in order to perform a host-directed operation corresponding to the host-directed operation command. An associated memory device and a controller thereof are also provided.