Flash Memory Bit Line Charging for Noise Reduction

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Solution Overview

Problem

Flash memory devices experience increased noise and higher precharging currents due to bit line coupling capacitance during programming operations, which can limit device performance and increase noise levels.

Innovation Solution

The solution involves charging both selected and unselected bit lines to a voltage during programming, distributing the capacitance over the data loading time to reduce peak current and minimize noise, thereby improving device performance.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Object-affected harmful factors

If bit lines are precharged before programming operations, then device noise is reduced, but precharging current increases

Engineering Contradiction:
Improvedevice noiseVSAvoidprecharging current
Core Design Contradiction:
Object-affected harmful factorsVSUse of energy by moving object

Solution Approach 1:

The patent segments the bit line precharging process by charging selected and unselected bit lines separately at different times. Selected bit lines are charged to an intermediate voltage while unselected bit lines are charged to a different voltage, allowing the precharging current to be distributed and managed in segments rather than all at once, thus reducing the peak current while still reducing noise

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent changes the voltage parameter during the precharging process by using different voltage levels for selected versus unselected bit lines. This parameter change allows the system to reduce noise through precharging while managing the current draw by not charging all bit lines to the same high voltage simultaneously

Inventive Principle:
Principle #35Parameter changes

2Object-affected harmful factors

If all bit lines are charged to the same voltage, then noise is minimized, but the capacitance load increases peak current

Engineering Contradiction:
ImprovenoiseVSAvoidpeak current
Core Design Contradiction:
Object-affected harmful factorsVSPower

Solution Approach 1:

The patent applies local quality by charging selected bit lines to one voltage level and unselected bit lines to another voltage level. This creates different electrical conditions in different parts of the system (selected vs. unselected bit lines), allowing noise to be minimized in the selected lines while reducing the overall capacitance load and peak current by not charging all lines to the maximum voltage

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach reduces device noise and improves performance by distributing the precharging current over the programming time, leading to more efficient data transfer and reduced noise levels.

Implementation Method 1

Flash memory devices experience increased noise and higher precharging currents due to bit line coupling capacitance during programming operations

Methodology Applied
Scientific EffectCapacitance: Capacitance

Data Source

PatentUS7486566B2Methods, apparatus, and systems for flash memory bit line charging
Publication Date: 2009.02.03 INTEL NDTM US LLC
  • US7486566B2 patent drawing
  • US7486566B2 patent drawing
  • US7486566B2 patent drawing

AI summary

Various embodiments include a circuit to receive data information, a memory array including memory cells coupled to a bit line, and control circuitry to charge the bit line while the data information is received at the circuit. The control circuitry may program the data information into a selected memory cell of the memory cells after the data information is received at the circuit. Other embodiments including additional methods, apparatus, and systems are disclosed.