Flash Memory Bit-State Mapping for Reliability and Speed

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Flash memory systems face a trade-off between data reliability and write/read speed due to the use of code modulation schemes, which can lower system performance by reducing write and read speeds.

Innovation Solution

A bit-state mapping method that maps m-bit data onto 2m states through subset partitioning operations, where adjacent states are processed as one state at lower levels and distinguished at higher levels, optimizing error correction capacity and data reliability while maintaining performance.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If code modulation schemes are used to improve data reliability through error correction code and signal mapping, then data reliability is improved, but write and read speeds are lowered resulting in reduced system performance

Engineering Contradiction:
Improvedata reliabilityVSAvoidwrite and read speeds
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent divides the m-bit data into multiple subsets at different levels (first to (m-1)th levels), where each subset is processed separately. This segmentation allows the system to apply error correction codes to smaller units, improving reliability while reducing the overall complexity of the mapping process and enabling faster write and read operations.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces a hierarchical level structure (first to (m-1)th levels) for organizing and processing data subsets. By adding this dimensional organization, the system can process data in a structured manner that improves reliability through multiple layers of error correction while maintaining efficient write and read speeds through the hierarchical approach.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Reliability

If code modulation schemes are used to improve data reliability, then error correction capability is enhanced, but device complexity increases due to more complex data mapping and error correction processes

Engineering Contradiction:
Improveerror correction capabilityVSAvoiddata mapping and error correction process complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent segments the complex error correction process into multiple manageable levels, where each level handles a specific subset of data. This segmentation reduces the complexity of individual processing stages while maintaining overall error correction capability, as each level can be implemented independently with standardized procedures.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent employs dynamic subset selection and processing at different levels, where the system can adaptively choose which subsets to process and how to allocate error correction resources. This dynamic approach optimizes the balance between error correction capability and processing complexity, allowing the system to adjust to different data conditions and error patterns.

Inventive Principle:
Principle #15Dynamics

Data Source

PatentUS9411679B2Code modulation encoder and decoder, memory controller including them, and flash memory system
Publication Date: 2016.08.09 SAMSUNG ELECTRONICS CO LTD
  • US9411679B2 patent drawing
  • US9411679B2 patent drawing
  • US9411679B2 patent drawing

AI summary

Disclosed is a bit-state mapping method of a flash memory system which maps m-bit data (m being a natural number more than 2) onto one of 2m states (voltage threshold distributions). The bit-state mapping method includes performing a subset partitioning operation during first to (m−1)th levels under a condition that two adjacent states are processed as one state; and distinguishing between the adjacent states while processing an (m)th level.