Flash Memory Debug Information Collection via Triggered Logging
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Solution Overview
Problem
Current memory devices lack the capability to provide detailed debug information to hosts, making it difficult for debugging, failure analysis, and troubleshooting, as they typically do not share operational data or error details effectively.
Innovation Solution
A system and method where a memory device, equipped with a memory controller and non-volatile memory, can be instructed by a host to collect and provide debug information through a host interface, using triggers to monitor and log specific operations and errors, allowing for detailed data exchange.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If memory devices do not share operational data and error details, then device complexity is reduced, but debugging capability and failure analysis efficiency deteriorate
Solution Approach 1:
The patent segments the memory device into distinct functional components: a debug information collection module that gathers operational data and error details, a processing module that analyzes the collected information, and a communication module that transmits debug data to external systems. This segmentation enables comprehensive debugging capability while managing device complexity through modular architecture.
Solution Approach 2:
The patent introduces an intermediary debug information processing system that acts as a mediator between the memory device and external debugging tools. This intermediary collects, processes, and formats debug information from the memory device, enabling effective debugging and failure analysis without requiring direct complex integration between all system components.
2Productivity
If memory devices collect and provide detailed debug information, then failure analysis speed is improved, but loss of time for data collection and transmission increases
Solution Approach 1:
The patent implements preliminary action by continuously collecting and pre-processing debug information in the background during normal memory device operation. Error logs, operational data, and diagnostic information are gathered and organized before failures occur, enabling immediate analysis when issues arise without time-consuming data collection delays.
Solution Approach 2:
The patent replaces manual debugging processes with automated electronic data collection and transmission systems. Debug information is automatically gathered, processed, and transmitted electronically to analysis systems, eliminating the need for physical device shipment and manual testing, thereby significantly reducing the time required for failure analysis.
Data Source
AI summary
This document generally describes systems, devices, methods, and techniques for obtaining debug information from a memory device. Debug information can include a variety of information associated with a memory device that can be used for debugging the device, such as a sequence of operations performed by the memory device and information regarding errors that have occurred (e.g., type of error, component of memory device associated with error). A memory device can be instructed by a host to obtain and provide debug information to the host. A memory device can be configured to obtain particular debug information using a variety of features, such as triggers. For instance, a memory device can use a trigger to collect debug information related to failed erase operations.