Flash Memory Block Group Segmentation for Defective Block Management

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Solution Overview

Problem

Multiple data channel flash memory storage devices face efficiency and lifespan issues due to defective blocks, as existing methods either reduce write speed or require entering read-only mode or retiring the device.

Innovation Solution

The method involves detecting defective blocks in block groups, dividing them into subgroups containing only defective or good blocks, and reorganizing these subgroups to form new block groups for efficient data storage, maintaining the original block size and improving device efficiency and lifespan.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If all data channels are used simultaneously for data transmission, then write speed and efficiency are improved, but the device cannot handle defective blocks and may require entering read-only mode or retiring the device

Engineering Contradiction:
Improvewrite speedVSAvoiddevice operation continuity
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The patent segments block groups into subgroups based on the status of data channels. When a defective block is detected in a block group, the system divides the block group into subgroups, isolating the defective block from functional blocks. This allows the functional subgroups to continue being used for data storage, maintaining device productivity while managing defective blocks effectively.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent implements dynamic management of data channels by detecting defective blocks in real-time and adjusting the configuration of block groups accordingly. The system dynamically reconfigures block groups to exclude defective blocks while maintaining the desired block group size for efficient data transmission, ensuring both high productivity and continuous device operation.

Inventive Principle:
Principle #15Dynamics

2Reliability

If defective blocks are skipped in write operations, then data can be stored in functional blocks, but write speed is retarded and efficiency is reduced

Engineering Contradiction:
Improvedata storage capabilityVSAvoidwrite efficiency
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent performs preliminary detection of defective blocks during manufacturing or initial operation and records their locations in advance. This preliminary action allows the system to pre-configure block groups that exclude known defective blocks, so that during normal write operations, the system can maintain high efficiency without needing to detect and skip defective blocks in real-time.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The system automatically manages defective blocks by detecting them and reconfiguring block groups without requiring external intervention or complex real-time decision-making during write operations. The flash memory controller autonomously handles the reconfiguration to maintain write efficiency while ensuring data is stored only in functional blocks.

Inventive Principle:
Principle #25Self-service

3Duration of action of stationary object

If block groups are reorganized to exclude defective blocks, then device lifespan is extended, but the complexity of block management increases

Engineering Contradiction:
Improvedevice lifespanVSAvoidblock management complexity
Core Design Contradiction:
Duration of action of stationary objectVSDevice complexity

Solution Approach 1:

The patent changes the organizational parameters of block groups by adjusting which blocks are included or excluded based on their functional status. When defective blocks are detected, the system modifies the block group configuration to maintain the desired group size while excluding defective blocks. This parameter change approach extends device lifespan through systematic reorganization without requiring fundamentally complex management mechanisms.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS7839684B2Defective block handling method for a multiple data channel flash memory storage device
Publication Date: 2010.11.23 JIANGSU HUACUN ELECTRONICS TECH CO LTD
  • US7839684B2 patent drawing
  • US7839684B2 patent drawing
  • US7839684B2 patent drawing

AI summary

The block groups of a multiple data channel flash memory storage device are detected for defective blocks. The block group containing any defective blocks is divided into subgroups, each of which contains only defective blocks or only good blocks. The subgroups containing only good blocks are selected to establish a new block group having the same amount of blocks as that of the original block groups.