Flash Memory Die Grouping by Endurance Metric
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Solution Overview
Problem
The endurance of non-volatile memory devices, such as flash memory, varies significantly across different die within the same device due to varying endurance capabilities, leading to a weak link that limits the overall robustness of the memory device.
Innovation Solution
The solution involves obtaining an endurance metric for each die, logically grouping them based on similar endurance metrics, and performing memory operations on a single die group to ensure that data is written in parallel to die with similar endurance levels, thereby managing and optimizing the usage of each die group.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If multiple die are used to increase storage capacity, then storage density is improved, but the variability in endurance metrics causes the overall reliability to deteriorate due to the weak link effect
Solution Approach 1:
The patent segments the plurality of die into multiple die groups based on their endurance metrics. Each die group contains die with similar endurance characteristics, allowing independent management and operation. This segmentation resolves the contradiction by enabling the system to utilize multiple die for increased capacity while managing reliability through targeted group-based operations that prevent the weak link effect.
Solution Approach 2:
The patent applies local quality by tailoring memory operations to specific die groups based on their individual endurance metrics. Different die groups receive different operation patterns customized to their endurance characteristics. This allows the system to maintain high reliability for each local group while achieving overall high capacity through the aggregated performance of all groups.
2Device complexity
If die with different endurance metrics are operated together, then device complexity is reduced, but the operational lifespan of the memory device deteriorates due to uneven wear
Solution Approach 1:
By segmenting die into endurance-based groups, the system maintains relatively simple management through group-level operations while extending operational lifespan. The segmentation enables uniform wear distribution across groups, preventing any single die from becoming a bottleneck that limits overall device lifespan.
Solution Approach 2:
The patent implements dynamic operation patterns that adapt to the endurance characteristics of different die groups. Operation patterns are adjusted based on group-specific endurance metrics, allowing the system to extend overall operational lifespan by preventing uneven wear accumulation while maintaining manageable complexity through automated group-based control.
Data Source
AI summary
The embodiments described herein methods and devices that enhance the endurance of a non-volatile memory (e.g., flash memory). The method includes obtaining, for each of the plurality of die, an endurance metric. The method also includes sorting the plurality of die into a plurality of die groups based on their corresponding endurance metrics, where each die group includes one or more die and each die group is associated with a range of endurance metrics. In response to a write command specifying a set of write data, the method further includes writing the write data to the non-volatile memory by writing in parallel subsets of the write data to the one or more die assigned to a single die group of the plurality of die groups.