Flash Memory ECC Across Wordline and Finger Dimensions
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Conventional flash memory controllers have limited error correction capabilities, particularly for errors occurring in three-dimensional blocks, leading to high data error rates during reading.
Innovation Solution
Implementing a flash memory controller with a buffer and error correction code circuit that performs wordline-dimensional and finger-dimensional error correction operations to generate check codes, correcting errors in super blocks by using distributed RAID mechanisms.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional single-dimension error correction is used, then device complexity is reduced, but error correction capability is insufficient for three-dimensional block errors
Solution Approach 1:
The patent applies two-dimensional error correction by introducing both wordline-dimensional check codes and finger-dimensional check codes. The error correction code circuit performs separate error correction operations in the wordline direction and finger direction, effectively adding a dimensional aspect to error correction that enables correction of three-dimensional block errors that single-dimension correction cannot handle.
2Reliability
If two-dimensional error correction is implemented, then error correction capability is improved, but processing time increases
Solution Approach 1:
The error correction code circuit generates both wordline-dimensional check codes and finger-dimensional check codes during the data writing process, before actual data storage. This preliminary generation of check codes in both dimensions allows for rapid error correction during reading without requiring extensive processing time at the correction stage.
Data Source
AI summary
A flash memory controller, to be coupled between a host device and a flash memory module, includes an error correction code (ECC) circuit. The ECC circuit performs a wordline-dimensional ECC operation upon specific data, sent from the host device to form a super block stored within the flash memory module, to generate wordline-dimensional parity data and performs a finger-dimensional ECC operation upon the specific data generate finger-dimensional parity data. The ECC circuit corrects an error of the superblock by using the wordline-dimensional parity data and the finger-dimensional parity data so as to obtain correct data content of the specific data.


