Flash Memory ECC Capability Table for Bad Column Management
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Solution Overview
Problem
In flash memory production, the presence of bad columns due to dust or masking issues affects the error correction ability, leading to reduced usable memory space and inefficient error correction capabilities across different memory planes within the same die.
Innovation Solution
A data storage device with a controller that utilizes an ECC capability table to manage and correct data across multiple memory planes within each die, allowing for different ECC capability values for each plane to optimize error correction based on the number of bad columns, thereby optimizing memory space usage and error correction efficiency.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If traditional uniform error correction is applied to all memory planes, then implementation is simple, but error correction efficiency deteriorates when different planes have different numbers of bad columns
Solution Approach 1:
The patent applies local quality by assigning different ECC capability values to different memory planes based on their specific bad column characteristics. Each memory plane is evaluated individually and configured with appropriate ECC parameters, allowing optimal error correction for each plane's actual condition rather than using a uniform approach across all planes.
Solution Approach 2:
The patent implements dynamics by making the ECC capability configurable and adaptable. The system can dynamically adjust ECC parameters based on the detected bad column distribution, allowing the error correction mechanism to adapt to different memory plane conditions and optimize performance for each specific configuration.
2Ease of manufacture
If the number of bad columns is high, then manufacturing defects are tolerated, but error correction ability deteriorates
Solution Approach 1:
The patent applies parameter changes by adjusting ECC capability values based on the number of bad columns detected in each memory plane. When high numbers of bad columns are present, the system modifies the ECC parameters to match the actual error correction needs, allowing the system to tolerate manufacturing defects while maintaining appropriate error correction ability for the given conditions.
3Quantity of substance
If uniform ECC capability is assigned to all memory planes, then configuration is simple, but memory space utilization deteriorates
Solution Approach 1:
The patent applies local quality by configuring each memory plane with its own specific ECC capability value based on its bad column characteristics. This allows each plane to use the minimum necessary ECC overhead for its actual error correction needs, maximizing usable memory space while maintaining appropriate error correction protection for each plane's specific conditions.
Data Source
AI summary
A data storage device includes a flash memory and a controller. The flash memory includes a plurality of dies, and each of the dies includes a first memory plane and a second memory plane, wherein the first memory plane includes a plurality of pages and the second memory plane includes a plurality of pages. The controller corrects data stored in the first memory plane and the second memory plane according to an ECC capability table, wherein the ECC capability table is arranged to record a first ECC capability value of the first memory plane and a second ECC capability value of the second memory plane.