Flash Memory Encoding for Lateral Charge Spreading

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Solution Overview

Problem

Flash memory devices face challenges in reducing the width of threshold voltage distribution in multi-bit cells, leading to increased read-failure rates due to overlapping voltage distributions and lateral charge spreading, which contaminates data over time.

Innovation Solution

A memory device with an encoder that generates codewords with specific maximum and minimum values of successive ones and zeros, and a programming unit that programs these codewords to multi-bit cells, using encoding schemes like Run Length Limited (RLL) codes to reduce lateral charge spreading and threshold voltage distribution width.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If data is programmed to multi-bit cells using conventional encoding, then storage capacity is increased, but threshold voltage distribution width increases leading to read failures

Engineering Contradiction:
Improvestorage capacityVSAvoidread failure rate
Core Design Contradiction:
Quantity of substanceVSReliability

Solution Approach 1:

The patent applies Run Length Limited (RLL) encoding to transform the data pattern before programming. This changes the parameter of data sequence composition by limiting the maximum number of successive identical bits (e.g., maximum 2 successive ones and 2 successive zeros). This parameter transformation reduces threshold voltage distribution width and prevents overlapping between programmed and erased states, thereby reducing read failure rates while maintaining multi-bit storage capacity

Inventive Principle:
Principle #35Parameter changes

2Quantity of substance

If data is programmed to multi-bit cells, then storage density is increased, but lateral charge spreading contaminates data

Engineering Contradiction:
Improvestorage densityVSAvoiddata contamination
Core Design Contradiction:
Quantity of substanceVSObject-affected harmful factors

Solution Approach 1:

RLL encoding transforms the data pattern to limit successive identical bits, which reduces the intensity of lateral charge spreading between adjacent memory cells. By controlling the maximum run length of identical bits, the patent minimizes charge contamination to neighboring cells while maintaining high storage density in multi-bit cells

Inventive Principle:
Principle #35Parameter changes

3Device complexity

If conventional encoding is used for data pages, then encoding simplicity is maintained, but transmission errors increase

Engineering Contradiction:
Improveencoding complexityVSAvoidtransmission error rate
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

The patent applies RLL encoding with specific parameters (maximum successive ones and zeros) to data pages before programming. This parameter-based transformation provides reference information for Phase Locked Loops (PLL) during transmission, reducing synchronization errors and improving reliability while adding manageable encoding complexity

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS8004891B2Memory device and method of programming thereof
Publication Date: 2011.08.23 SAMSUNG ELECTRONICS CO LTD
  • US8004891B2 patent drawing
  • US8004891B2 patent drawing
  • US8004891B2 patent drawing

AI summary

Example embodiments may provide a memory device and memory data programming method. The memory device according to example embodiments may encode a first data page to generate at least one first codeword and encode a second data page to generate a second codeword. The memory device may generate the first codeword with at least one of a maximum value of a number of successive ones and a second maximum value of a number of successive zeros. The memory device may program the at least one first codeword and the at least one second codeword to a plurality of multi-bit cells.