Flash Memory Page Buffer Latch for Continuous Reading

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Solution Overview

Problem

In NAND flash memory, the continuous reading operation faces challenges due to the need for a dedicated area for the page buffer/sensing circuit, which increases in size with larger page sizes, making it difficult to perform seamless reading without interfering with bit lines and causing capacitive coupling issues when data is divided into half pages for reading.

Innovation Solution

A semiconductor device and method for continuous reading that uses a single latch in the page buffer/sensing circuit, allowing data from one cache memory to be output while reading from the other, ensuring seamless data output even with high-frequency external clock signals by alternating the reading and output operations between cache memories C0 and C1.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If a dedicated area for the page buffer/sensing circuit is increased to support larger page sizes, then the continuous reading capability is improved, but the circuit area occupied increases

Engineering Contradiction:
Improvecontinuous reading capabilityVSAvoidcircuit area of page buffer/sensing circuit
Core Design Contradiction:
ProductivityVSArea of stationary object

Solution Approach 1:

The patent divides the page buffer/sensing circuit into two separate latches (L1 and L2), each capable of independently holding and processing data. This segmentation allows one latch to perform array reading while the other performs data output, enabling continuous reading operations without requiring a single large buffer area. The division of functionality between L1 and L2 resolves the contradiction by maintaining high productivity through parallel operations while keeping the total circuit area compact.

Inventive Principle:
Principle #1Segmentation

2Reliability

If data is divided into half pages and read separately, then the reading operation can proceed without interfering with bit lines, but capacitive coupling issues occur between bit lines

Engineering Contradiction:
Improvereading operation stabilityVSAvoidcapacitive coupling between bit lines
Core Design Contradiction:
ReliabilityVSObject-generated harmful factors

Solution Approach 1:

The patent applies preliminary action by precharging the bit lines before the reading operation begins. Specifically, the bit lines are precharged to a reference voltage level prior to sensing the memory cell data. This preliminary precharging action stabilizes the bit line voltage, preventing capacitive coupling interference during the subsequent half-page reading operations. The sensing circuit then reads data from one half page while the bit lines remain stable, and subsequently reads from the other half page without interference.

Inventive Principle:
Principle #10Preliminary action

3Speed

If array reading time is reduced to meet high-frequency external clock signals, then data output synchronization is improved, but the reading precision may be compromised

Engineering Contradiction:
Improvedata output speedVSAvoidreading precision
Core Design Contradiction:
SpeedVSMeasurement precision

Solution Approach 1:

The patent implements continuity of useful action through seamless pipeline operations between L1 and L2 latches. While L1 performs array reading of the next page, L2 simultaneously outputs data to the external interface. This continuous parallel operation ensures that data output keeps pace with high-frequency external clock signals without interruption. The pipeline architecture maintains reading precision because each latch completes its reading operation fully before transitioning to the next phase, ensuring adequate sensing time despite the high-speed output requirements.

Inventive Principle:
Principle #20Continuity of useful action

Data Source

PatentUS11315640B2Semiconductor device and continuous reading method
Publication Date: 2022.04.26 WINBOND ELECTRONICS CORP
  • US11315640B2 patent drawing
  • US11315640B2 patent drawing
  • US11315640B2 patent drawing

AI summary

A continuous reading method of a flash memory is provided, including: after outputting data held in a cache memory (C0) of a latch (L1) of a page buffer/sensing circuit, data of the cache memory (C0) of a next page is read from a memory cell array, and the read data of the cache memory (C0) is held in the latch (L1). After outputting data held in the cache memory (C1) of the latch (L1), data of the same next page of the cache memory (C1) is read from the memory cell array, and the read data of the cache memory (C1) is held in the latch (L1).