Flash Memory Cell Programming with Photon-Assisted Tunneling
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Solution Overview
Problem
Existing flash memory devices face challenges in achieving efficient programming and erasing times while minimizing power consumption and maintaining endurance, as they rely on high electric fields that can degrade the tunnel insulator.
Innovation Solution
Illuminating the flash memory cell with photons whose energy approaches the barrier height of the tunnel insulator, enhancing the Fowler-Nordheim tunneling current and allowing for lower programming voltages, thus reducing electric fields and improving endurance.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Speed
If high programming voltages are used to achieve fast programming times, then programming speed is improved, but power consumption increases and tunnel insulator degradation accelerates
Solution Approach 1:
The patent changes the energy state of electrons by introducing photons with energy close to the tunnel insulator barrier height. This allows electrons to tunnel through the insulator at lower voltages by combining photon energy with electrical energy, thereby reducing power consumption while maintaining programming speed
Solution Approach 2:
The patent introduces photons as an intermediary carrier that mediates the tunneling process. The photons bridge the energy gap between the applied voltage and the tunnel insulator barrier height, enabling efficient charge transfer without requiring high voltages
2Speed
If high programming voltages are applied to reduce program time, then programming speed is improved, but tunnel insulator degradation increases
Solution Approach 1:
The patent changes the energy delivery mechanism from purely electrical to a combination of optical and electrical energy. By tuning photon energy to match the tunnel insulator barrier height, electrons can tunnel effectively at lower voltages, reducing electrical stress and degradation on the tunnel insulator while maintaining programming speed
Solution Approach 2:
The patent substitutes part of the electrical field mechanism with an optical field mechanism. Instead of relying solely on high electrical fields to drive tunneling, the system uses photon-assisted tunneling where optical energy supplements the electrical energy, reducing the mechanical/electrical stress on the tunnel insulator
3Device complexity
If conventional tunneling is used without photon assistance, then device structure is simple, but programming efficiency is low
Solution Approach 1:
The patent introduces photons as an intermediary to enhance the tunneling process. This adds a new dimension to the tunneling mechanism without fundamentally changing the device structure, maintaining simplicity while dramatically improving programming efficiency through photon-assisted tunneling
Solution Approach 2:
The patent makes the existing tunnel insulator serve multiple functions: it acts as both the barrier for charge storage and the target for photon absorption. The same insulator layer that provides data retention also benefits from photon-assisted tunneling, eliminating the need for additional specialized components
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables shorter program/erase times with reduced power consumption and increased endurance by leveraging photon-assisted tunneling to accumulate charge faster and lower electric fields across the tunnel insulator.
Implementation Method 1
Illuminating the flash memory cell during programming/erase increases the Fowler-Nordheim tunneling current through the tunnel insulator by way of the photon assisted tunneling (PAT) effect. The PAT effect is similar to the photoelectric effect except that the electron struck by the photon in the PAT effect is promoted over the tunnel barrier rather than being removed from the metal.
Implementation Method 2
increases the Fowler-Nordheim tunneling current through the tunnel insulator
Data Source
AI summary
A flash memory cell of a flash memory device is illuminated with light during programming and/or erasing. The wavelength of the light is selected such that the photons impinging on the flash memory cell have an energy that approaches the barrier height (conduction band offset) of the tunnel insulator. Illuminating the flash memory cell during programming/erase increases the tunneling current through the tunnel insulator by way of the photon assisted tunneling (PAT) effect.


