Flash Memory Read Adjustment via Adjacent Cell Feedback

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Solution Overview

Problem

Flash memory devices experience reduced reliability in read operations due to floating gate to floating gate (FG-FG) interference, which causes shifts in threshold voltage values, affecting the accuracy of information retrieval.

Innovation Solution

The solution involves reading adjacent cells to obtain feedback information on shift threshold voltage values, which are then used to adjust the read operation of target cells, thereby reducing the impact of FG-FG interference and improving data reliability.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If read operation is performed on target cell, then data retrieval is enabled, but threshold voltage shifts due to FG-FG interference reduce reliability

Engineering Contradiction:
Improveread operation reliabilityVSAvoidthreshold voltage measurement accuracy
Core Design Contradiction:
ReliabilityVSMeasurement precision

Solution Approach 1:

The patent implements a feedback mechanism where the read operation on the target cell is adjusted based on the threshold voltage value obtained from the adjacent cell. The controller reads the adjacent cell first, obtains its threshold voltage value, and uses this information to determine the appropriate read voltage for the target cell. This feedback loop compensates for FG-FG interference effects, thereby maintaining measurement precision while enabling reliable data retrieval.

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The patent performs a preliminary read operation on the adjacent cell before reading the target cell. By obtaining the threshold voltage value of the adjacent cell in advance, the system can pre-calculate the appropriate read voltage for the target cell, accounting for potential FG-FG interference. This preliminary action enables the system to compensate for interference effects before the actual target cell read operation occurs.

Inventive Principle:
Principle #10Preliminary action

2Reliability

If adjacent cells are read to obtain feedback information, then reliability of target cell read is improved, but operation time increases

Engineering Contradiction:
Improvedata retrieval reliabilityVSAvoidread operation time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent applies partial action by reading only the necessary adjacent cells (typically one or two neighboring cells) rather than all cells in the memory array. This selective approach provides sufficient feedback information to compensate for FG-FG interference on the target cell while minimizing the additional time required. The system performs exactly the minimum necessary read operations on adjacent cells to achieve reliable target cell read.

Inventive Principle:
Principle #16Partial or excessive action

3Quantity of substance

If FG-FG interference is present, then cell density can be increased, but threshold voltage shifts reduce information accuracy

Engineering Contradiction:
Improvecell densityVSAvoidinformation retrieval accuracy
Core Design Contradiction:
Quantity of substanceVSMeasurement precision

Solution Approach 1:

The feedback mechanism reads adjacent cells to determine their threshold voltage values, which indicate the presence and magnitude of FG-FG interference. This information is used to adjust the read voltage for the target cell, compensating for interference effects and maintaining measurement precision even in high-density configurations where FG-FG interference is more pronounced.

Inventive Principle:
Principle #23Feedback

Data Source

PatentUS8897078B2Method, apparatus, and system for improved read operation in memory
Publication Date: 2014.11.25 MICRON TECHNOLOGY INC
  • US8897078B2 patent drawing
  • US8897078B2 patent drawing
  • US8897078B2 patent drawing

AI summary

Various embodiments include methods, apparatus, and systems for reading an adjacent cell of a memory array in an electronic device to determine a threshold voltage value of the adjacent cell, the adjacent cell being adjacent a target cell, and reading the target cell of the memory array using a wordline voltage value based on the threshold voltage value of the adjacent cell. Additional apparatus, systems, and methods are described.