Flash Memory Read Method Using Conditional Threshold Voltage Adjustment
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Solution Overview
Problem
Flash memory cells, particularly NAND-type, face challenges in accurately reading data due to disturbances in threshold voltage distribution caused by increased program/erase cycles and retention time, leading to incorrect data retrieval using original control gate voltage settings.
Innovation Solution
A method and memory controller that perform multiple read operations with different threshold voltages, followed by error correction hard and soft decoding, to enhance data retrieval accuracy and reliability.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If multiple read operations with different threshold voltages are performed to improve data reading accuracy, then the reliability of data retrieval is improved, but the read time increases
Solution Approach 1:
The patent applies partial action by performing multiple read operations only when necessary - specifically when the first read operation with initial threshold voltage yields an uncorrectable error after hard decoding. The system selectively executes second and third read operations with adjusted threshold voltages only in error cases, rather than always performing all reads, thus balancing reliability improvement with time consumption.
Solution Approach 2:
The reading process is segmented into distinct stages: first read operation with initial threshold voltage, hard decoding attempt, conditional second read operation with increased threshold voltage, and conditional third read operation with decreased threshold voltage. This segmentation allows the system to progress through reading steps only as needed, improving efficiency by avoiding unnecessary operations.
2Manufacturing precision
If multiple read operations with different threshold voltages are performed to adapt to changed threshold voltage distribution, then the manufacturing precision of data retrieval is improved, but the complexity of the reading process increases
Solution Approach 1:
The patent implements dynamic threshold voltage adjustment based on error detection results. The reading process adapts by modifying threshold voltages in subsequent operations only when errors are detected, creating a dynamic response to actual memory cell states rather than using fixed threshold sequences. This dynamic approach reduces unnecessary complexity while maintaining precision.
Solution Approach 2:
The system employs feedback mechanisms where hard decoding results from the first read operation determine whether subsequent read operations with different threshold voltages should be executed. The feedback loop (read → decode → detect error → adjust threshold → re-read) enables precision improvement while managing complexity through conditional execution based on actual error conditions.
Data Source
AI summary
An exemplary method for reading data stored in a flash memory. The method comprises: controlling the flash memory to perform a first read operation upon the memory cell with a first threshold voltage to obtain a first binary digit for representing a bit of the N bits data; performing an error correction hard decode according to the first binary digit; controlling the flash memory to perform a second read operation upon the memory cell with a second threshold voltage to obtain a second binary digit for representing the bit of the N bits data, if the error correction hard decode indicates an uncorrectable result; and performing an error correction soft decode according to the first binary digit and the second binary digit.


