Flash Memory Reference Source Regulation
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Solution Overview
Problem
The existing methods for regulating reference sources in non-volatile memory devices, such as flash memory, require external test machines to read and correct signal values, leading to serialized controls and decreased productivity due to device-specific corrections and the need for external intervention.
Innovation Solution
A method and device that integrate a regulation device within the memory device, allowing for automatic regulation of voltage, current, and frequency references using a control unit, comparators, and multiplexers, enabling parallel testing and minimizing external signals required for correction.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If external test machines are used to read and correct signal values for each device, then device-specific corrections can be applied, but productivity decreases due to serialized controls
Solution Approach 1:
The memory device performs self-regulation of reference sources by comparing its own output signals with reference signals and automatically adjusting configuration registers. The device tests itself without external test machine intervention, achieving both precise device-specific corrections and parallel testing capability.
Solution Approach 2:
The testing function is divided into separate modular components within the memory device: signal generation units, comparison units, and configuration register units. Each reference source (voltage, current, frequency) has its own dedicated testing and regulation circuitry, enabling independent parallel operation.
2Manufacturing precision
If external test machines perform ad hoc corrections for each device, then accurate device-specific regulation is achieved, but testing time increases significantly
Solution Approach 1:
The memory device contains pre-configured configuration registers and built-in comparison logic that are ready before testing. When a reference signal deviates from its target value, the device immediately compares and adjusts the configuration without waiting for external test machine processing, dramatically reducing adjustment time.
Solution Approach 2:
The device continuously monitors its reference signals against target values using internal comparators. When deviations are detected, the feedback loop automatically adjusts configuration registers to correct the deviation, enabling real-time self-correction without external intervention and reducing overall testing time.
3Productivity
If multiple devices are tested in parallel, then productivity increases, but device complexity increases due to integration of regulation device
Solution Approach 1:
The built-in regulation device serves multiple functions: it generates reference signals, compares them with target values, determines deviations, and adjusts configuration registers. This multi-functional integration enables parallel testing of multiple devices while the added complexity is offset by the elimination of external test machine requirements.
Data Source
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AI summary
The invention relates to a method and a relative automatic regulation device of the reference sources in a non volatile memory device, for example a flash memory. The method is characterised by the following steps:: - providing, in the memory device (2), a regulation device (1) of the reference sources (5, 6, 7) and at least one start command (START) for the entry in regulation mode; - providing, on the device (2), at least one command for the selection of a corresponding reference source to be regulated; - applying an external reference signal (VREF, IREF); - starting the automatic regulation step by means of said command (START); - detecting the result of the regulation step by means of a logic output (FAIL) of the memory device (2); - if the result of the regulation of a given source is positive, proceeding, by means of the same process steps, with the regulation of another source.