Flash Memory Charge Loss Compensation via Refill Program
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Solution Overview
Problem
Flash memory cells experience reduced reliability and charge retention capability due to high program and erase cycle (PE cycle) stress, leading to charge loss and reduced data retention over time.
Innovation Solution
A memory device and compensation method that perform a reading operation on programmed memory cells to detect charge loss, and then execute a refill program operation to recharge the affected memory cells, thereby maintaining data retention.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If flash memory cells undergo high program and erase cycles, then storage capacity and usage flexibility are improved, but charge retention capability deteriorates
Solution Approach 1:
The system performs a reading operation before data is actually lost to detect charge loss phenomena in advance. By identifying memory cells with charge loss before the data becomes completely unreliable, the system can proactively initiate refill program operations to restore the charges, thereby maintaining charge retention capability while allowing high program and erase cycle usage.
2Reliability
If refill program operation is performed on charge loss memory cells, then data retention is improved, but additional program operations increase wear
Solution Approach 1:
The system implements a feedback mechanism where reading operations continuously monitor the charge status of memory cells. When charge loss is detected, the system triggers refill program operations specifically on the affected cells. This targeted approach ensures data retention is maintained while minimizing unnecessary program operations, as only cells with actual charge loss undergo refilling.
3Reliability
If reading operation is performed to detect charge loss, then data reliability is maintained, but additional read operations increase power consumption
Solution Approach 1:
The system performs reading operations on memory cells to detect charge loss, applying partial action only where needed. Rather than continuously reading all memory cells, the system targets specific cells that exhibit charge loss phenomena, thereby maintaining data reliability while minimizing unnecessary read operations and associated power consumption.
Data Source
AI summary
A memory device, such as a 3D AND type flash memory, and a compensation method of data retention thereof are provided. The compensation method includes the following. A reading operation is performed on each of a plurality of programmed memory cells of the memory device. Whether a charge loss phenomenon occurs in the programmed memory cells is determined through the reading operation to set the programmed memory cells to be charge loss memory cells. A refill program operation is performed on the charge loss memory cells.


