Flash Memory Configuration via Concurrent Serial Interface Cycling
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Solution Overview
Problem
The existing methods for configuring and testing nonvolatile flash memory devices are time-consuming and require direct interaction with the internal architecture, making it difficult to concurrently perform memory cycling and other functional testing.
Innovation Solution
A system and method that utilize a serial or parallel interface to concurrently cycle or configure flash memory by executing sequences of erasure and writing specific patterns, allowing for simultaneous testing of other functional units, with a flash controller managing the memory operations to automate the configuration process and free up the serial interface for other testing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Loss of time
If flash memory is configured using traditional methods with direct interaction with internal architecture, then the configuration process can be completed, but the test and configuration time is excessively long
Solution Approach 1:
The patent introduces a serial interface as an intermediary between external devices and the flash memory controller. This interface abstracts the complex internal architecture (pages, blocks, erasure requirements) from external interactions, allowing simple read/write commands to be translated into proper flash memory operations. This mediator approach eliminates the need for external devices to understand flash memory's internal structure, significantly reducing configuration time while maintaining proper memory management.
Solution Approach 2:
The serial interface is designed with universal functionality to handle multiple operations (configuration, testing, data transfer) through a single standardized protocol. This multi-functional interface can communicate with any flash memory device regardless of its internal architecture, making the configuration process universally applicable and time-efficient without requiring device-specific complex interactions.
2Productivity
If the serial interface is used for memory cycling operations, then the interface is occupied and cannot be used for other functional testing concurrently
Solution Approach 1:
The flash memory controller is enhanced with self-service capabilities to autonomously manage memory cycling operations. The controller can independently execute erasure cycles, pattern writing, and verification without requiring continuous external intervention. This allows the serial interface to be freed up for other functional testing while the memory controller handles its own configuration and cycling tasks autonomously.
Solution Approach 2:
The system performs preliminary actions by initiating memory cycling operations before other functional tests are required to complete. The flash memory controller starts erasure and pattern writing sequences in advance, allowing these time-consuming operations to proceed concurrently with other testing activities through the shared serial interface, thereby enabling true concurrent testing.
3Reliability
If flash memory is erased and written in traditional page-by-page manner, then data integrity is maintained, but the configuration process becomes time-consuming
Solution Approach 1:
The patent implements periodic action by systematically cycling through different data patterns (e.g., all zeros, all ones, alternating patterns) during the configuration process. The flash memory controller sequentially writes these patterns across memory pages in organized cycles, ensuring comprehensive coverage of all memory locations while maintaining efficient throughput. This periodic pattern cycling approach balances data integrity verification with configuration speed.
Solution Approach 2:
The system merges multiple operations into unified processes: erasure and pattern writing are combined into integrated configuration sequences, and verification is merged with the writing process itself. By combining these operations and executing them as coordinated sequences through the serial interface, the system achieves faster configuration while maintaining data integrity through systematic verification at each stage.
Data Source
AI summary
A system for configuring or testing memory may cycle a memory array while substantially concurrently performing other functional testing. In particular implementations, the system may configure, or cycle, a flash memory using a serial interface and test other functional units using the same serial interface substantially concurrently with cycling the flash memory. In some implementations, cycling the flash memory includes erasing and writing to the flash memory in specific patterns in order to dissipate charge that may have accumulated during a fabrication process.