Flash Memory Programming Speed via Selective Verify Skipping

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Solution Overview

Problem

Multi-level cell (MLC) flash memory devices face challenges in balancing programming speed and accuracy, as program verify operations increase programming time but are necessary for accuracy, leading to inefficiencies.

Innovation Solution

Implementing an incremental step pulse programming (ISPP) process with selective skipping of program verify operations based on voltage increments, threshold voltage shifts, and the number of program loops to optimize programming efficiency and accuracy.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If program verify operations are performed in all program loops, then programming accuracy is maintained, but programming time increases

Engineering Contradiction:
Improveprogramming accuracyVSAvoidprogramming time
Core Design Contradiction:
Manufacturing precisionVSLoss of time

Solution Approach 1:

The patent applies local quality by differentiating the treatment of different memory cells within the same array. Specifically, it identifies and separates first memory cells requiring verify operations from second memory cells where verify operations can be skipped. This localized differentiation allows the system to maintain high accuracy for critical cells while optimizing speed for less critical cells, thereby resolving the contradiction between overall accuracy and programming time.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent implements partial action by selectively performing program verify operations only on a subset of memory cells (first memory cells) rather than all memory cells. The control logic determines which cells require verification based on their programming state, applying verify operations partially to those that need it most, while skipping them for cells where the programming outcome is sufficiently certain, thus reducing total verification time while maintaining acceptable accuracy.

Inventive Principle:
Principle #16Partial or excessive action

2Productivity

If selective skipping of program verify operations is implemented, then programming speed is enhanced, but programming accuracy may deteriorate

Engineering Contradiction:
Improveprogramming speedVSAvoidprogramming accuracy
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The patent employs feedback mechanisms through the control logic that monitors programming conditions and determines selectively which memory cells require verify operations. The control logic uses feedback from the programming process state, voltage increments, and memory cell characteristics to make intelligent decisions about verify operation skipping, ensuring that accuracy is not compromised while maximizing speed improvements.

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The patent applies parameter changes by modifying the programming parameters (voltage increments, program loop counts) dynamically based on memory cell characteristics and programming stage. By adjusting these parameters selectively for different memory cell groups, the system optimizes both speed and accuracy - using fewer verify operations for cells with favorable parameters while maintaining verification for cells requiring higher precision, thus resolving the speed-accuracy contradiction.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enhances programming speed while maintaining accuracy by strategically skipping verify operations in MLC flash memory devices, improving overall performance and efficiency.

Implementation Method 1

each of the program loops comprises a program pulse operation that applies a program pulse to the selected memory cells

Methodology Applied
Scientific EffectCharge injection:

Implementation Method 2

at least one of the program loops comprises a program verify operation that verifies a program state of the selected memory cells

Methodology Applied
Scientific EffectThreshold voltage measurement:

Data Source

PatentUS8539138B2Flash memory device and method of programming flash memory device
Publication Date: 2013.09.17 SAMSUNG ELECTRONICS CO LTD
  • US8539138B2 patent drawing
  • US8539138B2 patent drawing
  • US8539138B2 patent drawing

AI summary

A flash memory device performs a program operation using an incremental step pulse programming (ISPP) scheme comprising a plurality of program loops. In each of the program loops, a program pulse operation is performed to increase the threshold voltages of selected memory cells, and a program verify operation is performed to verify a program status of the selected memory cells. The program verify operation can be selectively skipped in some program loops based on a voltage increment of one or more of the program pulse operations, an amount by which threshold voltages of the selected memory cells are to be increased in the ISPP scheme, or a total number of program loops of the ISPP scheme.