Flat Beam Optical Analysis for Marker Particle Positioning
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Solution Overview
Problem
Existing optical analysis devices face challenges in accurately measuring the concentration of dilute solutions due to limitations in detecting the spatial positions and light intensity of marker particles, particularly in scenarios where high precision and speed are required.
Innovation Solution
An optical analysis device and method that employs a light source unit, beam shaping unit, and photodetector to generate and shape a flat light beam, allowing for relative movement with respect to a test sample, enabling detection of light intensity and spatial positions of marker particles, and utilizing a computer-readable medium to process light intensity distribution data for precise particle positioning.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a conventional light beam is used for irradiating marker particles, then the device structure is simple, but the measurement precision of particle positions and light intensity is insufficient
Solution Approach 1:
The light beam is segmented into multiple independent line beams arranged in the minor axis direction, allowing parallel illumination of multiple particle positions simultaneously. This segmentation enables high-precision spatial position detection across an extended measurement region while maintaining a relatively simple device structure by reusing the same photodetector and processing components.
Solution Approach 2:
The invention transitions from a single-point measurement approach to a multi-line spatial distribution measurement by arranging line beams in the minor axis direction. This dimensional expansion of the light beam structure enables simultaneous measurement of light intensity and spatial positions of multiple particles without proportionally increasing device complexity.
2Productivity
If a single point measurement is performed, then the device structure is simple, but the productivity and measurement speed are limited
Solution Approach 1:
The light beam is divided into multiple line beams that can simultaneously illuminate and detect multiple particle positions along the minor axis. This parallel measurement capability significantly increases productivity by measuring multiple particles in a single scan cycle, while the device complexity increases only moderately due to the systematic arrangement of optical components.
Solution Approach 2:
The relative movement unit continuously scans the line beam configuration across the sample, enabling continuous measurement of particle positions and light intensity over time. This continuous scanning approach maintains high productivity by eliminating idle measurement periods while the structured line beam arrangement ensures efficient use of the measurement process.
3Measurement precision
If light intensity distribution is not corrected, then the processing is simple, but the measurement precision of particle concentration and position is degraded
Solution Approach 1:
The invention implements feedback processing where the detected light intensity distribution data is used to calculate and apply correction factors that compensate for the line beam's intensity profile variations. This feedback mechanism restores measurement precision by eliminating systematic errors while adding only moderate processing complexity through computational correction algorithms.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables high-accuracy, high-speed measurement of marker particles' positions and light intensity, improving the precision and efficiency of optical analysis by correcting light intensity profiles and estimating spatial positions, thus overcoming previous limitations in dilute solution analysis.
Implementation Method 1
a light source unit configured to generate a light beam which causes marker particles to emit light
Implementation Method 2
a beam shaping unit configured to form a flat beam portion with to at least a portion of the light beam
Data Source
AI summary
An optical analysis device includes a light source, a beam shaping unit, a relative movement unit, a photodetector, and a position detector. The light source unit generates a light beam. The beam shaping unit forms a flat beam portion. The relative movement unit is configured to cause the flat beam portion and a test sample including marker particles to relatively move in a minor axis direction of the flat beam portion. The photodetector is configured to detect a light intensity and a light emitting position in a plane orthogonal to the minor axis direction. The position detector is capable of detecting spatial positions of the marker particles on the basis of information on a relative movement amount of the flat beam portion, information on the light intensity and the light emitting position, and a change of the light intensity generated according to a relative movement of the flat beam portion.