Flat Panel Detector Bias Signal Segmentation for Noise Reduction

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Solution Overview

Problem

Conventional flat panel X-ray detectors suffer from high noise levels, which affects the quality of the images produced, and there is a need for a solution to reduce this noise to improve image clarity and sensitivity.

Innovation Solution

The proposed flat panel detector incorporates a base substrate with scanning lines, data lines, bias signal lines, and detecting units arranged in an array, where the bias signal lines are divided into groups and insulated from each other, each connected to separate driving chips, allowing for independent adjustment and reducing noise by isolating interference effects to specific groups.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If bias signal lines are connected together in conventional flat panel detectors, then the structure is simple and manufacturing is easier, but noise increases and image uniformity deteriorates

Engineering Contradiction:
Improveimage qualityVSAvoidsignal line configuration
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The bias signal lines are divided into multiple independent groups, with each group connected to a separate driving chip. This segmentation isolates interference effects to specific groups, preventing noise propagation across the entire detector array, thereby improving image quality while managing device complexity through modular organization

Inventive Principle:
Principle #1Segmentation

2Object-affected harmful factors

If all bias signal lines are connected to the same driving chip, then the device structure is simpler, but interference affects the entire system and noise increases

Engineering Contradiction:
Improvenoise levelVSAvoiddriving chip configuration
Core Design Contradiction:
Object-affected harmful factorsVSDevice complexity

Solution Approach 1:

The system segments the bias signal distribution by assigning different groups of bias signal lines to different driving chips. This isolation ensures that interference or noise affecting one driving chip does not propagate to other groups, thereby reducing overall noise levels while distributing the driving chip configuration across multiple components

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Each group of bias signal lines is assigned to a specific driving chip, creating local independence. This allows each driving chip to manage its own signal group with localized quality control, preventing local interference from affecting the entire system and thereby reducing noise while accepting distributed chip configuration

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration reduces noise by isolating interference to specific signal line groups, allowing for quick restoration of bias signals and improving the uniformity of grayscale images, thereby enhancing the sensitivity and clarity of the images produced.

Implementation Method 1

the visible light is converted into electric signals by the photodiodes in the detecting units

Methodology Applied
Scientific EffectPhotoelectric effect: Photoelectric Effect

Implementation Method 2

the X-ray conversion layer may be made of a scintillator material... When the array substrate is irradiated by X rays, the X rays are converted into visible light by the X-ray conversion layer

Methodology Applied
Scientific EffectScintillation: Scintillation

Data Source

PatentUS20240337764A1Flat panel detector and detecting apparatus
Publication Date: 2024.10.10 BEIJING BOE SENSOR TECH CO LTD
  • US20240337764A1 patent drawing
  • US20240337764A1 patent drawing
  • US20240337764A1 patent drawing

AI summary

A flat panel detector and a detecting apparatus. The flat panel detector includes a base substrate, and scanning lines, data lines, signal lines and detecting units in an array on the base substrate; each detecting units includes a switch sub-circuit and a photosensitive device; control terminals of switch sub-circuits in detecting units in a same row are connected with a same scanning line; first terminals of switch sub-circuits in detecting units in a same column are connected with a same data line; in each detecting unit, a second terminal of the switch sub-circuit is connected with a first terminal of the photosensitive device; second terminals of photosensitive devices of the detecting units in the same column are connected with a same bias signal line, the bias signal lines are divided into groups, the bias signal lines in different groups are mutually insulated and connected with different driving chips.