Flat Panel Detector With Dual-Sided Light Collection
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Solution Overview
Problem
Existing flat panel detectors suffer from significant visible light loss and electromagnetic interference, leading to reduced detection quantum efficiency (DQE) and modulation transfer function (MTF), particularly due to the absorption and scattering of X-rays within the scintillator layer, which also necessitates higher X-ray doses for effective imaging.
Innovation Solution
The flat panel detector incorporates a first optical assembly with a scintillator layer and a first light guide component to guide visible light to a first and second image sensor, increasing the distance between sensors and reducing electromagnetic interference, while also utilizing a dual detection unit configuration with separate scintillator layers and image sensors to enhance light collection and reduce X-ray usage.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a single scintillator layer and single image sensor are used, then the device structure is simple, but visible light loss and electromagnetic interference increase, reducing detection quantum efficiency and modulation transfer function
Solution Approach 1:
The patent divides the detector into multiple independent detection units, each with its own scintillator layer and image sensor. This segmentation allows each unit to function independently, reducing electromagnetic interference between sensors while collecting visible light from different regions of the scintillator, thereby improving detection quantum efficiency without excessive structural complexity
Solution Approach 2:
The patent transitions from a single-plane detection architecture to a multi-layer stacked architecture. By arranging scintillator layers and image sensors in different spatial dimensions (stacked configuration), the system collects visible light from multiple angles and reduces electromagnetic interference through increased spatial separation, resolving the contradiction between detection efficiency and structural complexity
2Measurement precision
If the distance between image sensors is reduced, then the device size is smaller, but electromagnetic interference between sensors increases, reducing modulation transfer function
Solution Approach 1:
The detector is divided into multiple independent detection units with separate image sensors. This segmentation allows each sensor to operate independently with its own signal processing pathway, reducing electromagnetic interference and maintaining high modulation transfer function even when units are closely stacked, thus achieving compact size without sacrificing measurement precision
3Reliability
If a conventional single-layer scintillator is used, then the manufacturing process is simple, but visible light absorption and scattering occur, reducing detection quantum efficiency and requiring higher X-ray doses
Solution Approach 1:
The scintillator is divided into multiple thin layers rather than using a single thick layer. This segmentation reduces the path length for visible light propagation within each layer, minimizing absorption and scattering losses. Each thin scintillator layer can be manufactured separately and then stacked, making the process manageable while achieving high detection quantum efficiency
Solution Approach 2:
The patent transitions from a single thick scintillator layer to multiple thin stacked layers. This dimensional change in the scintillator structure reduces visible light attenuation by dividing the light path into shorter segments, improving detection quantum efficiency while the modular stacked architecture facilitates manufacturing through repeated deposition processes
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This design improves detection quantum efficiency (DQE) and modulation transfer function (MTF) by minimizing light loss and interference, allowing for better image quality and reduced X-ray dosage.
Implementation Method 1
a first scintillator layer for converting at least part of X-rays into a first visible light
Implementation Method 2
a first image sensor and a second image sensor... for receiving the first visible light
Data Source
Figure 1~2A
Figure 2B~4
Figure 5~6A
AI summary
Disclosed are a flat panel detector and a fabrication method therefor. The flat panel detector comprises a first optical assembly, and the first optical assembly has a first side and a second side along the thickness direction of the flat panel detector and comprises: a first scintillator layer, for converting at least a portion of rays into first visible light, and a first light conducting structure stacked with the first scintillator layer and used for conducting the first visible light. The flat panel detector further comprises a first image sensor assembly, stacked with the first optical assembly and used for receiving the first visible light. The first image sensor assembly comprises a first image sensor and a second image sensor which are disposed on the first side and the second side of the first optical assembly, respectively. By providing the second image sensor, a portion of the first visible light emitted from an upper surface of the first scintillator layer is able to reach the second image sensor for imaging, thus avoiding the loss of the first visible light due to propagation within the first scintillator layer.