Flat Panel Inspection Camera Vertical Movement Focus Selection
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Solution Overview
Problem
Conventional methods for inspecting LCD panel pixel circuit patterns face challenges in achieving accurate line width measurements due to limitations in automatic focus repeatability and image clarity across different colors and substrate curvatures, especially as panel resolution increases and circuit patterns miniaturize.
Innovation Solution
A method involving horizontal and vertical camera movement to acquire multiple images, with automatic focusing followed by selection of the highest definition image for defect determination, enhancing accuracy beyond traditional automatic focus limitations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If automatic focus module is added to photograph pixels of different colors, then image clarity for each color is improved, but repeatability limitation prevents consistent focus across multiple measurements
Solution Approach 1:
The patent performs preliminary actions by capturing multiple images at different focal positions before final defect determination. The system pre-acquires a series of images at different focus depths and selects the clearest one, ensuring consistent measurement quality across different colors and locations without relying on automatic focus repeatability.
Solution Approach 2:
The patent adds a new dimension to the measurement process by introducing the focal position dimension. Instead of relying solely on automatic focus at a single position, the system captures images across multiple focal positions (different depths), transforming a 2D measurement problem into a 3D solution space where the optimal focus can be selected.
2Productivity
If resolution of LCD panels becomes higher and circuit patterns are miniaturized, then panel functionality is improved, but line width measurement accuracy deteriorates due to automatic focus limitations
Solution Approach 1:
For miniaturized circuit patterns in high-resolution panels, the system performs preliminary capture of multiple images at different focal positions. This allows the measurement system to pre-identify the optimal focus image among several candidates, ensuring accurate line width measurement even when patterns are too small for reliable automatic focusing.
Solution Approach 2:
The patent addresses miniaturization challenges by adding the focal depth dimension to the measurement process. By capturing images across multiple focal positions, the system creates a deeper measurement space that accommodates the reduced feature sizes in high-resolution panels, allowing accurate measurement of previously unmeasurable miniaturized patterns.
3Device complexity
If camera remains stationary at measurement location, then measurement process is simple, but image definition varies due to substrate curvature and automatic focus limitations
Solution Approach 1:
The patent introduces vertical camera movement to compensate for substrate curvature effects. By moving the camera vertically across a set range, the system adds a spatial dimension that allows capturing images at different depths, ensuring that images from curved substrate areas are properly focused and defined.
Solution Approach 2:
The system performs preliminary image capture at multiple vertical positions before final defect analysis. By pre-acquiring images at different vertical positions and selecting the highest definition one, the system ensures consistent image quality across curved substrates without complicating the overall measurement workflow.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach significantly improves defect detection accuracy by selecting the highest definition image from a series captured with vertical camera movement, effectively addressing the limitations of automatic focus repeatability and miniaturization challenges in high-resolution LCD panels.
Implementation Method 1
automatically focusing the camera on a target to be measured of the flat panel at the measurement location
Implementation Method 2
acquiring a plurality of images of the target to be measured by vertically moving the focused camera within a set region
Data Source
AI summary
Disclosed is a method for inspecting a flat panel. The method for inspecting the flat panel includes the steps of: arranging a camera at a measurement location of the flat panel by horizontally moving at least one of the flat panel and the camera; automatically focusing the camera with respect to a measuring target of the flat panel at the measurement location; acquiring a plurality of images for the measuring target by vertically moving the focused camera within a set region on the basis of the present location of the camera when focusing the camera; selecting the image having the most definition for the measuring target among the acquired images; processing the selected image; and determining whether the measuring target is defective or not.