Flexible Display Conductive Pattern Grain Size Optimization
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Solution Overview
Problem
Flexible display devices face issues with cracking due to bending, as existing technologies struggle to balance conductive pattern grain size for optimal flexibility and resistance, leading to increased power consumption and reduced reliability.
Innovation Solution
A flexible display device with a conductive pattern having a grain size of 10 nm to 100 nm, strategically disposed on bending parts of the substrate, which secures proper driving characteristics and improved flexibility by optimizing the number of grains per unit area and layer thickness.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the conductive pattern has a large grain size, then the resistance is reduced, but the flexibility deteriorates and cracking occurs during bending
Solution Approach 1:
The patent changes the grain size parameter of the conductive pattern to a specific range (10 nm to 100 nm) to simultaneously achieve low resistance and high flexibility. This parameter optimization allows the conductive pattern to maintain electrical performance while preventing cracking during bending operations.
Solution Approach 2:
The patent employs a composite conductive pattern structure consisting of multiple grains with controlled size distribution. This composite approach combines the benefits of small grains (flexibility) and large grains (low resistance) by creating a multi-grain system where finer grains provide flexibility and larger grains within the range maintain conductivity.
2Ease of operation
If the conductive pattern has a small grain size, then the flexibility is improved, but the resistance increases leading to higher power consumption
Solution Approach 1:
The patent optimizes the grain size parameter within the range of 10 nm to 100 nm to balance flexibility and resistance. This parameter control ensures that grains are small enough to provide flexibility during bending but large enough to maintain low resistance and acceptable power consumption.
3Ease of operation
If the conductive pattern is disposed on the bending part, then the flexibility is maintained, but cracking occurs due to stress concentration
Solution Approach 1:
The patent applies local quality control by specifically optimizing the grain size of conductive pattern grains located on the bending part to be within 10 nm to 100 nm. This localized optimization ensures that the conductive pattern in the high-stress bending region has enhanced crack resistance while maintaining flexibility, without affecting other regions of the display device.
Data Source
AI summary
A flexible display device including a flexible substrate and a conductive pattern. The flexible substrate includes a bending part in which a bending occurs. At least a portion of the conductive pattern is disposed on the bending part and the conductive pattern includes grains. Each grain has a grain size of about 10 nm to about 100 nm.