Flexible Display Crack Detection via Non-Display Area Switching Transistors

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Solution Overview

Problem

Flexible OLED screens face challenges in detecting cracks during manufacturing and use, particularly when the curvature radius exceeds tolerance, leading to fractures and open-circuit issues in the non-display area, affecting display quality and yield.

Innovation Solution

A display device with a pixel array and detection lines in the non-display area, where each detection line is connected to switching transistors, allowing sub-pixels to emit light and display bright lines of corresponding colors when a crack is present, enabling accurate crack detection and positioning.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If the curvature radius of the flexible screen exceeds tolerance during bending, then the flexibility and adaptability of the display device are improved, but cracks occur in the non-display area causing open-circuit issues and reducing manufacturing yield

Engineering Contradiction:
ImproveflexibilityVSAvoidmanufacturing yield
Core Design Contradiction:
Adaptability or versatilityVSReliability

Solution Approach 1:

The patent implements detection lines and switching transistors in advance within the non-display area before the bending process. These components are pre-positioned to detect cracks that may occur during manufacturing or use, allowing for early identification of defects before they affect the overall yield and reliability of the flexible display device.

Inventive Principle:
Principle #10Preliminary action

2Measurement precision

If detection lines are added to the non-display area to detect cracks, then the measurement precision and reliability of crack detection are improved, but the device complexity and manufacturing process difficulty increase

Engineering Contradiction:
Improvecrack detection precisionVSAvoidstructure complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The detection lines are designed to automatically detect cracks through electrical continuity testing without requiring external detection equipment. The switching transistors and display pixels work together to self-identify crack locations by changing their electrical state when a crack occurs, eliminating the need for complex external measurement systems and reducing overall device complexity.

Inventive Principle:
Principle #25Self-service

3Reliability

If the detection lines are connected to switching transistors to enable crack detection, then the reliability of the detection system is improved, but the manufacturing precision and process complexity increase

Engineering Contradiction:
Improvedetection system reliabilityVSAvoidconnection precision
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

The patent merges the detection lines with existing manufacturing structures by integrating them into the non-display area alongside switching transistors and pixel connections. This consolidation approach allows crack detection functionality to be added without requiring separate, high-precision manufacturing processes, as the detection components share the same fabrication steps and connection infrastructure as the display elements.

Inventive Principle:
Principle #5Merging (Combining)

Data Source

PatentUS10948535B2Display device and detection method for the display device
Publication Date: 2021.03.16 BOE TECHNOLOGY GROUP CO LTD
  • US10948535B2 patent drawing
  • US10948535B2 patent drawing
  • US10948535B2 patent drawing

AI summary

The present disclosure provides a display device and a detection method for the display device. The display device includes a display area and a non-display area. The display device comprises: a pixel array at the display area, a plurality of switching transistors at the non-display area, and at least one detection line at the non-display area. The pixel array includes a plurality of sub-pixels. The plurality of switching transistors are electrically connected to a plurality of columns of sub-pixels of the pixel array in one-to-one correspondence. Each of the at least one detection line is electrically connected to a part of the plurality of switching transistors.