Flexible Display Inspection Transistors for Bezel Reduction
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Solution Overview
Problem
Flexible display devices face issues with signal line cracks when bent, leading to defects and increased manufacturing costs due to the need for inspecting wiring before attaching flexible films, and there is a desire to minimize the bezel size for a wider display area.
Innovation Solution
A flexible display device structure with a flexible substrate featuring a display area, non-display areas, and inspection transistors to detect signal line cracks, allowing for a reduced bezel size by positioning inspection transistors in the pad area to inspect link lines across a wide area, including the bending and pad areas.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of stationary object
If the substrate is bent to reduce bezel size, then the display area is increased, but the wiring in the bending area and adjacent area may be cracked
Solution Approach 1:
The patent applies preliminary action by inspecting the wiring in the bending area and adjacent area before attaching the flexible film (COF or FPCB) to the display device. This pre-inspection detects potential wiring cracks that may occur during substrate bending, allowing defects to be identified before they cause device failure after assembly.
2Reliability
If inspection is performed in the bending area and adjacent area, then wiring defects can be detected, but the manufacturing process complexity increases
Solution Approach 1:
The patent applies self-service by using the existing display device structure and components to perform the inspection function. The inspection process utilizes the device's own wiring and structure to detect defects, rather than requiring completely separate external inspection equipment or complex additional systems.
3Area of stationary object
If the non-display area is reduced to minimize bezel, then the display area is increased, but the space for inspection transistors and wiring is reduced
Solution Approach 1:
The patent applies local quality by positioning inspection transistors specifically in the pad area, which is a localized region with available space. This allows the inspection function to be implemented without requiring extensive non-display area, as the inspection transistors are concentrated in a specific local region rather than distributed throughout the entire non-display area.
Data Source
AI summary
A flexible display device can include a flexible substrate including a display area including a plurality of pixels, a first non-display area extended from the display area, a bending area extended from the first non-display area, a second non-display area extended from the bending area, and a pad area extended from the second non-display area and including a plurality of pads; a plurality of data lines configured to transmit a data voltage to the plurality of pixels; a plurality of link lines extending through the first non-display area, the bending area, the second non-display area, and the pad area to connect the plurality of data lines with the plurality of pads; and a plurality of inspection transistors arranged in the pad area, each of the plurality of inspection transistors including a first electrode connected to one of the plurality of link lines.