Multi-Directional Flexible Probe Pin for Weak Material Inspection
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Solution Overview
Problem
Linear probe pins often apply excessive force to inspection objects with mechanically weak materials, such as organic EL panels, leading to damage during inspection.
Innovation Solution
A probe pin design featuring a first contact part, a middle part, a first flexible part, and a movable part, allowing the probe pin to contact the inspection object in a direction different from its connection to the inspection device, with the first flexible part moving the first contact part relative to the middle part and the movable part moving the second contact part in a direction intersecting with the first arrangement direction.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a linear probe pin is used to contact electrodes on an inspection object, then the inspection device can establish electrical connection, but excessive force is applied to mechanically weak materials causing damage
Solution Approach 1:
The probe pin employs dynamic flexible parts that allow movement in multiple directions. The first flexible part connects the first contact part to the middle part, enabling movement in a first direction, while the second flexible part connects the second contact part to the middle part, enabling movement in a second direction. This dynamic structure allows the probe pin to adapt to position deviations and reduce excessive force application to mechanically weak inspection objects.
Solution Approach 2:
The probe pin is divided into multiple independent segments: a first contact part, a middle part, a second contact part, a first flexible part, and a second flexible part. Each segment can move independently, allowing the probe pin to accommodate position deviations in multiple directions without transmitting excessive force to the inspection object, thereby preventing damage while maintaining inspection reliability.
2Adaptability or versatility
If a linear probe pin with contacts moving in the same direction is used, then the structure is simple, but it cannot handle diverse inspection objects with different electrode arrangements
Solution Approach 1:
The probe pin incorporates flexible parts that enable dynamic movement in multiple directions. The first flexible part allows movement in a first direction, while the second flexible part allows movement in a second direction that is different from the first direction. This multi-directional flexibility allows the probe pin to adapt to diverse electrode arrangements on different inspection objects without requiring complex reconfiguration mechanisms.
Solution Approach 2:
By segmenting the probe pin into multiple independently movable parts (first contact part, middle part, second contact part, first flexible part, second flexible part), the structure achieves versatility for handling diverse inspection objects. Each segment can move independently to accommodate different electrode positions and orientations, providing adaptability without requiring an overly complex integrated mechanism.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This design enables safe inspection of diverse objects without damaging them, as the probe pin can apply force in a direction that does not compromise the integrity of mechanically weak materials, supporting a wide range of inspection devices and objects.
Implementation Method 1
a first flexible part connected to the first contact part and the middle part and expanding and contracting along a first arrangement direction connecting the first contact part and the middle part to move the first contact part relative to the middle part in the first arrangement direction
Implementation Method 2
a movable part connected to the middle part and the second contact part and configured to move the second contact part relative to the middle part in a direction intersecting with the first arrangement direction
Data Source
AI summary
A probe pin includes a first contact part and a second contact part; a middle part located between the first contact part and the second contact part; a first flexible part configured to move the first contact part relative to the middle part in the first arrangement direction; and a movable part configured to move the second contact part relative to the middle part in a direction intersecting with the first arrangement direction.


