Flexible Silicon X-ray Grating for Large Spot Source Imaging
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Solution Overview
Problem
Conventional X-ray differential phase contrast (DPC) imaging systems require a synchrotron radiation or weak micro-focused X-ray source due to the need for sufficient spatial coherence, which is not feasible with commercial CT scanners using large spot X-ray sources and large pixel-size detectors, limiting their ability to detect position changes in X-ray fringe patterns.
Innovation Solution
A silicon-based X-ray grating system with a thin silicon base layer and strategically placed silicon bridges is used, allowing for the use of a large spot X-ray source and enabling detection of X-ray interference fringe patterns with a three-grating based X-ray DPC imaging system, where the first grating filters the X-ray source into thin slits and the third grating analyzes the fringe patterns to extract absorption, differential phase contrast, and dark-field images.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional X-ray DPC imaging systems use synchrotron radiation or weak micro-focused X-ray sources to achieve sufficient spatial coherence, then measurement precision of X-ray fringe patterns is improved, but device complexity and cost increase significantly
Solution Approach 1:
The patent changes the parameters of the grating structure itself rather than the X-ray source. By using a thin silicon base layer (no more than 70 microns thick) with strategically placed silicon bridges, the grating becomes flexible enough to maintain functionality with large spot X-ray sources, effectively changing the system parameters from source-focused to component-focused optimization
Solution Approach 2:
The patent extracts the coherence requirement from the X-ray source and transfers it to the grating structure design. By removing the dependency on specialized X-ray sources and embedding the coherence-maintaining function into the grating's physical structure (thin base layer with bridges), the system can use commercially available large spot sources
2Strength
If X-ray gratings use thick rigid base layers to provide structural support, then strength and stability are improved, but flexibility and adaptability to curved surfaces deteriorate
Solution Approach 1:
The patent directly applies the principle of thin films by using a silicon base layer no more than 70 microns thick. This thin film structure provides sufficient mechanical support for the grating while being flexible enough to conform to curved surfaces, enabling mounting on cylindrical or other non-planar geometries without requiring thick rigid materials
Solution Approach 2:
The patent segments the base layer by introducing silicon bridges at specific locations rather than creating a continuous solid structure. This segmentation allows the base layer to flex and conform to curved surfaces while the bridges provide necessary structural support at critical points, achieving both flexibility and strength
3Strength
If silicon bridges are placed between all adjacent silicon ridges to maximize structural support, then strength is improved, but flexibility and ability to conform to curved surfaces deteriorate
Solution Approach 1:
The patent applies local quality by placing silicon bridges only at specific locations between certain adjacent silicon ridges rather than uniformly between all ridges. This localized bridging provides structural support where needed while leaving other areas flexible for conforming to curved surfaces, achieving optimal balance between strength and adaptability
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration allows for effective imaging with commercially available X-ray sources and detectors, enhancing the spatial resolution and field of view of X-ray DPC imaging systems, enabling the detection of X-ray fringe pattern changes and improving image quality.
Implementation Method 1
A three-grating based X-ray DPC imaging system provides a solution of using a more commonly used large spot X-ray source and large pixel-size X-ray detectors
Implementation Method 2
differential phase contrast (DPC) imaging systems require a synchrotron radiation or weak micro-focused X-ray source due to the need for sufficient spatial coherence
Data Source
AI summary
An X-ray grating configured for use in an X-ray imaging apparatus is provided. The X-ray grating has a silicone-based base layer. A plurality of silicon-based ridges is on a surface of the silicon-based base layer, wherein the plurality of silicon-based ridges from a plurality of trenches, where a trench of the plurality of trenches is between two silicon-based ridges of the plurality of silicon-based ridges. A plurality of silicon-based bridges extends between adjacent silicon-based ridges, wherein each silicon-based ridge of the plurality of silicon-based ridges is connected to at least one adjacent silicon-based ridge of the plurality of silicon-based ridges by at least one of a silicon-based bridge of the plurality of silicon-based bridges and wherein at least one of a plurality of four adjacent trenches does not have any silicon-based bridges.