Flexible Wiring Substrate Inspection Plating Leads
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Solution Overview
Problem
The frequent replacement of connectors in inspection devices due to durability issues poses a challenge in effectively inspecting flexible electric wiring substrates, especially when narrow pitch connectors are used in ink jet printing apparatuses, leading to accuracy and strength concerns.
Innovation Solution
The flexible electric wiring substrate incorporates plating leads that allow inspection probes to be abutted directly, eliminating the need for frequent connector replacements by providing a durable and accurate electrical connection through electrolytic plating and a two-sided wiring configuration.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a substrate-to-substrate connector is used for connection with the wiring of the inspection device, then the electrical connection is established, but the connector reaches the end of lifetime with about 50 times of fitting and needs to be replaced frequently
Solution Approach 1:
The patent extracts the inspection connection function from the substrate-to-substrate connector by providing a dedicated inspection connector. This separation allows the substrate-to-substrate connector to maintain its original function without the wear and tear of frequent inspection connections, thereby extending its lifetime and reducing replacement frequency.
Solution Approach 2:
The inspection connector is designed with multi-functionality, serving both as a connection point for inspection devices and as a test structure for verifying the quality of the flexible electric wiring substrate. This universal design optimizes the connector for inspection purposes while maintaining durability.
2Measurement precision
If the spring probe technique is used to inspect the connector, then the inspection can be performed, but the contact needs to be inserted in and removed from a through-hole every time and the spring probe structure is difficult to apply to connectors with narrow pitch
Solution Approach 1:
The patent replaces the mechanical spring probe system with a more suitable inspection connector design. Instead of using a displaceable probe holding member that requires insertion and removal through holes, the inspection connector provides direct electrical contact points that are accessible and suitable for narrow pitch connectors, simplifying the inspection process while maintaining accuracy.
3Productivity
If the connector is fitted and removed frequently for inspection, then the inspection can be performed, but the connector durability decreases and replacement is needed often
Solution Approach 1:
The patent segments the connection functions by providing separate connectors for substrate-to-substrate connection and for inspection purposes. This segmentation allows the inspection connector to be specifically optimized for frequent connection/disconnection operations, while the substrate-to-substrate connector maintains its durability for long-term installation.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution enhances the durability and accuracy of electrical connections, reducing the need for frequent connector replacements and enabling reliable inspection of flexible electric wiring substrates with improved connector land and plating lead arrangements.
Implementation Method 1
a plating lead that is electrically connected with the pad through the wiring and is used as a current supply port at least in a case of electrolytic plating of the pad
Data Source
AI summary
Provided is a flexible electric wiring substrate including multiple groups each including wiring, a connector land that electrically connects a terminal of a connector to the wiring, a pad that connects a terminal of an electronic part to the wiring, and a plating lead that is electrically connected with the pad through the wiring and is used as a current supply port at least in a case of electrolytic plating of the pad, in which the multiple plating leads are arranged such that each of multiple inspection probes arrayed on a probe holding substrate is abutted onto each plating lead.


