Flexible X-ray Backscatter Detector for Non-planar Inspection
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Solution Overview
Problem
Conventional X-ray backscatter systems face limitations in achieving adequate resolution and contrast due to the use of rigid, planar detectors that fail to effectively capture X-ray backscatter from non-planar target surfaces, resulting in poor image quality and inability to detect anomalies reliably.
Innovation Solution
A flexible, one-piece X-ray backscatter detector with a continuous scintillating material layer is used, which can be oriented to match the target surface geometry, enhancing the capture of scattered X-rays and improving imaging characteristics by reducing the variation in incident angles.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If rigid, planar detectors are used in conventional X-ray backscatter systems, then the system structure is simple and stable, but the image resolution and contrast are inadequate due to inability to capture backscatter from non-planar surfaces
Solution Approach 1:
The patent applies this principle by replacing rigid, planar detectors with flexible detectors that can be conformally mounted to non-planar target surfaces. The flexible detector includes a flexible substrate with scintillating material deposited thereon, allowing the detector to adapt to complex geometries while maintaining detection precision.
Solution Approach 2:
The patent applies this principle by using curved or non-planar detector surfaces that match the curvature of the target object. This allows the detector to maintain optimal incident angles across the entire detection surface, improving both image resolution and the ability to capture backscatter from non-planar surfaces.
2Productivity
If rigid, planar detectors are used, then manufacturing and assembly are straightforward, but dead zones appear and X-ray backscatter capture is reduced
Solution Approach 1:
The flexible detector design eliminates dead zones by allowing the detector to conform to the target surface, ensuring continuous coverage. The flexible substrate with deposited scintillating material can be manufactured using techniques such as sputtering or chemical vapor deposition, which are compatible with flexible substrates like polyimide or polyester.
Solution Approach 2:
The patent applies this principle by dividing the detector into multiple segments or panels that can be individually manufactured and then assembled to cover complex surfaces. This segmentation approach maintains ease of manufacture while eliminating dead zones through proper positioning of adjacent segments.
3Measurement precision
If detectors are oriented to match target surface geometry, then imaging characteristics improve, but the device complexity increases
Solution Approach 1:
The flexible detector inherently adapts to target surface geometry through its flexibility, eliminating the need for complex positioning mechanisms. The detector can be manually or automatically conformally mounted to match the target surface, improving imaging characteristics without significantly increasing device complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The flexible detector significantly improves image resolution and contrast, enabling accurate non-destructive inspection of complex geometries by capturing a greater amount of X-ray backscatter and reducing 'dead zones', resulting in enhanced imaging data and detail.
Implementation Method 1
an X-ray radiation source configured to emit X-rays, with the X-rays configured to at least partially penetrate a target; a collimator in communication with the X-ray radiation source, with the collimator configured to form an X-ray beam using at least a portion of the X-ray radiation emitted by the X-ray radiation source
Implementation Method 2
When the X-ray beam encounters the target object, some, or all of the X-rays in the X-ray beam are scattered by the target object in various directions. In particular, the X-rays may be scattered from the surface of the target object and/or from the sub-surface of the target object. The scattered X-rays are referred to as backscatter.
Implementation Method 3
at least one layer of X-ray scintillating material, with the layer of X-ray scintillating material configured to substantially cover the flexible substrate
Data Source
AI summary
Methods, apparatuses, and systems are disclosed for generating X-ray backscatter images of a target by employing a flexible, deformable and flexible X-ray backscatter detector comprising a scintillating material layer comprising a scintillating jet print ink.