Flip-Chip Copper Pillar Packaging Process

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Solution Overview

Problem

Conventional flip-chip packaging processes using solder bumps face issues with insufficient strength and capacitance density, difficulty in controlling the etching of the under bump metallurgy (UBM) layer, and require complex reflow steps, which hinder the development of high-speed charging and discharging elements.

Innovation Solution

The process replaces solder bumps with copper pillars, where a copper pillar is formed on a wafer with a bond pad and passivation layer, and then embedded in solder on a substrate, covering all external surfaces, allowing for improved etching control and eliminating the need for reflow steps.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Strength

If solder bumps are used in conventional flip-chip packaging, then the connection is formed, but the strength and capacitance density are insufficient for high-speed charging and discharging elements

Engineering Contradiction:
Improvestrength and capacitance densityVSAvoidconnection performance
Core Design Contradiction:
StrengthVSReliability

Solution Approach 1:

The patent changes the material parameter from solder to copper, forming copper pillars instead of solder bumps. This material substitution provides higher strength and capacitance density while maintaining electrical connection functionality, directly addressing the insufficient strength and capacitance density of conventional solder bumps for high-speed applications

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent creates a composite structure by embedding copper pillars in solder material. The copper pillar provides high strength and capacitance density, while the surrounding solder material ensures reliable bonding and electrical connection, combining the advantages of both materials to achieve both high performance and reliability

Inventive Principle:
Principle #40Composite materials

2Manufacturing precision

If conventional etching process is used for UBM layer, then the UBM layer is removed, but the etching selectivity between solder bumps and UBM layer is poor making the step difficult to control

Engineering Contradiction:
Improveetching controlVSAvoidetching process difficulty
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The patent changes the material parameter from solder to copper for the pillar structure. This creates better etching selectivity between copper and the UBM layer compared to solder and UBM, making the etching process easier to control and achieve higher manufacturing precision in removing the UBM layer

Inventive Principle:
Principle #35Parameter changes

3Device complexity

If reflow steps are used in conventional process, then the solder bumps are melted and formed, but the entire process becomes quite complicated

Engineering Contradiction:
Improveprocess complexityVSAvoidbump formation precision
Core Design Contradiction:
Device complexityVSManufacturing precision

Solution Approach 1:

The patent extracts and eliminates the reflow step from the conventional process by using copper pillars instead of solder bumps. Since copper pillars are formed through electroplating or printing without requiring melting, the complex reflow process is removed, simplifying the entire fabrication process while maintaining precise bump structure formation

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent replaces the thermal-mechanical process (reflow melting) with a electrochemical or printing process (electroplating/printing). This substitution eliminates the need for high-temperature reflow steps, reducing process complexity while achieving precise copper pillar formation through controlled deposition

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

4Object-affected harmful factors

If copper pillar is exposed to ambience, then the external surfaces are accessible, but oxidation occurs on the copper pillar surfaces

Engineering Contradiction:
Improveoxidation resistanceVSAvoidsurface integrity
Core Design Contradiction:
Object-affected harmful factorsVSStrength

Solution Approach 1:

The patent introduces solder material as an intermediary substance that surrounds and covers the copper pillar. This solder material acts as a protective barrier between the copper surface and the ambient environment, preventing oxidation while allowing the copper pillar to maintain its structural strength and electrical properties

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The solder material creates an inert protective environment around the copper pillar, isolating it from oxygen in the ambient atmosphere. This effectively creates a localized inert environment that prevents oxidation of the copper surface while maintaining the structural integrity and strength of the copper pillar

Inventive Principle:
Principle #39Inert atmosphere (Inert environment)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach provides copper pillars with high strength and capacitance density, simplifies the processing steps by eliminating reflow, and prevents oxidation of the copper pillar surfaces.

Implementation Method 1

a copper material is filled into the opening

Methodology Applied
Scientific EffectElectroplating: Electroplating

Implementation Method 2

the solder covers substantially all of the external surfaces of the copper pillar

Methodology Applied
Scientific EffectOxidation prevention: Oxidation

Data Source

PatentUS7476564B2Flip-chip packaging process using copper pillar as bump structure
Publication Date: 2009.01.13 ADVANCED SEMICON ENG INC
  • US7476564B2 patent drawing
  • US7476564B2 patent drawing
  • US7476564B2 patent drawing

AI summary

A flip-chip packaging process is disclosed. The present invention is featured in forming a copper pillar on a wafer, forming a solder on a substrate; and enabling the solder to substantially cover the entire externally-exposed surface of the copper pillar, thereby connecting the copper pillar to the substrate. The copper pillar of the present invention can be such as a prism or a cylinder.