Flip-Flop Timing Circuit Layout for Delayed Clock Edge Reliability
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Solution Overview
Problem
The miniaturization of integrated circuits poses challenges in design and manufacturing, particularly in ensuring reliable operation sequences due to variations in clock signal edges, which can be exacerbated by lower supply voltage differences, affecting the reliability of timing circuits in master-slave flip-flops.
Innovation Solution
A modified timing circuit with multiple time delay circuits and specific gate configurations ensures that the transmission gate is opened before the gated input circuit changes state, using clock signals with controlled delays to maintain reliable operation even with large variations in clock signal edges, and is implemented with inverters and NOR gates in a layout that optimizes transistor configurations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Use of energy by moving object
If the miniaturization process is applied to integrated circuits, then power consumption is reduced and functionality is increased, but design and manufacturing specifications become stricter and reliability challenges increase
Solution Approach 1:
The timing circuit generates clock signals with predetermined delays before they are needed by the flip-flop circuits. This preliminary generation of properly timed clock signals ensures that even as devices are miniaturized, the timing relationships are established in advance, preventing reliability issues from arising due to timing violations in scaled-down devices
2Use of energy by moving object
If supply voltage differences are reduced, then power consumption is lowered, but the reliability of timing circuits is affected due to variations in clock signal edges
Solution Approach 1:
The invention changes the timing parameters of clock signals by using delay circuits with specific propagation delays. This allows the timing circuit to maintain proper operation sequences even when supply voltage varies, as the delay circuits are designed to provide sufficient timing margin independent of voltage fluctuations, thus maintaining reliability while allowing lower supply voltages
3Volume of moving object
If standard timing circuits are used in miniaturized devices, then device size is reduced, but operation sequence reliability deteriorates due to clock signal edge variations
Solution Approach 1:
The timing circuit acts as an intermediary between the clock signal source and the flip-flop circuits. It introduces controlled delay elements that mediate the timing relationships, ensuring that clock signals are properly synchronized before reaching the flip-flops. This intermediary timing circuit maintains operation sequence reliability even in miniaturized devices where direct connections would be too fast and prone to timing violations
Data Source
AI summary
A method of forming a semiconductor device includes forming active regions, forming S/D regions, forming MD contact structures and forming gate lines resulting in corresponding transistors that define a first time delay circuit having a first input configured to receive a first clock signal and having a first output configured to generate a second clock signal from the first clock signal; and corresponding transistors that define a second time delay circuit having a second input configured to receive the second clock signal and having a second output configured to generate a third clock signal from the first clock signal; forming a first gate via-connector in direct contact with the first gate line atop the first-type active region in the first area; and forming a second gate via-connector in direct contact with the second gate line atop the second-type active region in the second area.