Flip-Flop Gate Layout for Single-Event Upset Resistance
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Solution Overview
Problem
The miniaturization of integrated circuits has led to stricter design and manufacturing specifications, along with reliability challenges due to increased sensitivity to noise and single-event upsets, necessitating improved circuit designs to enhance reliability and accuracy.
Innovation Solution
The integration of specific logic gates and transistor configurations, such as NOR, NAND, and tri-state gates, within flip-flop circuits, reduces the number of sensitive nodes and minimizes distances between critical nodes, thereby enhancing reliability and accuracy by reducing transient noise and single-event upsets.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If integrated circuits are miniaturized to reduce device size and power consumption, then productivity and functionality are improved, but reliability deteriorates due to increased sensitivity to noise and single-event upsets
Solution Approach 1:
The circuit is divided into separate functional blocks with distinct sensitive nodes isolated from each other. By segmenting the circuit architecture and using separate transistor groups for different logic functions, the patent reduces the collection of critical charge at any single node, thereby maintaining reliability while achieving miniaturization.
Solution Approach 2:
Isolation structures and insulating layers are introduced as intermediary elements between sensitive nodes and between active regions. These intermediaries prevent direct coupling and reduce noise interference, allowing miniaturized circuits to maintain reliability by blocking the propagation of single-event upsets.
2Reliability
If the number of sensitive nodes is reduced to improve reliability, then resistance to single-event upsets is improved, but device complexity increases
Solution Approach 1:
Multiple logic functions are combined into shared circuit structures where common nodes serve multiple purposes. By merging transistor networks and using shared isolation structures, the patent reduces the total number of sensitive nodes without significantly increasing device complexity.
Solution Approach 2:
Circuit elements are designed to perform multiple functions simultaneously. For example, isolation structures serve both as electrical barriers and as part of the active device geometry, while transistor configurations provide both logic functionality and inherent noise immunity, reducing the need for additional dedicated reliability components.
Data Source
AI summary
A flip-flop includes a first input circuit, a first NOR logic gate, a first stacked gate circuit and a first NAND logic gate. The first input circuit is coupled to a first node, and configured to generate a first signal responsive to at least a first data signal, a first clock signal, or a second clock signal. The first NOR logic gate is coupled between the first node and a second node, and configured to generate a second signal responsive to the first signal or a first reset signal. The first stacked gate circuit is coupled between the first node and a third node, and configured to generate a third signal responsive to the first signal. The first NAND logic gate is coupled between the third and fourth node, and is configured to generate a fourth signal responsive to the third signal or a second reset signal.