Floating Isolation Circuitry for Precise DUT Voltage Testing
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Solution Overview
Problem
Existing test systems face challenges in maintaining high precision when testing devices under test (DUTs) due to changes in impedance caused by connecting the DUT to the resistor ladder, which affects the voltage applied and impairs testing accuracy.
Innovation Solution
The circuitry includes high-impedance operational amplifiers connected to the resistor ladder and low-impedance outputs facing the DUT, with a floating power supply system using a reference operational amplifier to maintain a predefined voltage differential, isolating the resistor ladder from the DUT and ensuring precise voltage delivery.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the DUT is connected to the resistor ladder for testing, then the test system can measure the DUT operation, but the impedance change affects voltage delivery precision
Solution Approach 1:
The patent introduces operational amplifiers as intermediary components between the resistor ladder and the DUT. These op-amps act as buffer amplifiers that isolate the resistor ladder from the DUT's impedance variations, ensuring that voltage delivery precision is maintained regardless of the DUT's impedance changes during testing.
Solution Approach 2:
The patent segments the test system into distinct functional blocks: the resistor ladder for voltage generation, operational amplifiers for buffering and impedance matching, and the DUT under test. This segmentation allows each component to operate independently with optimized characteristics, preventing impedance interactions from degrading measurement precision.
2Ease of operation
If the DUT is connected to the resistor ladder, then testing can be performed, but impedance changes impair voltage delivery precision
Solution Approach 1:
Operational amplifiers serve as intermediary buffer stages that enable straightforward DUT connection while maintaining voltage precision. The high input impedance of the op-amps minimizes loading effects on the resistor ladder, and the low output impedance provides stable voltage delivery to the DUT, thus enabling easy testing without precision loss.
Solution Approach 2:
The patent utilizes the operational amplifiers' ability to maintain constant output voltage parameters despite variations in load impedance. The op-amps actively adjust their output to compensate for impedance changes, ensuring that the voltage delivered to the DUT remains precise throughout the testing process.
Data Source
AI summary
Example circuitry is usable in testing a device under test (DUT). The circuitry includes test inputs; a resistor ladder including resistors electrically connected in series, with the resistor ladder being electrically connected to each of the test inputs; and first operational amplifiers, with each first operational amplifier including a first input and a first output, with each first input being electrically connected to the resistor ladder, and with each first output to electrically connect to the DUT. The circuitry includes floating circuitry which includes a second operational amplifier. The second operational amplifier includes a second input electrically connected to the resistor ladder and a reference input; a first power input to receive a first voltage; and a second power input to receive a second voltage. The floating circuitry is configured to apply the first voltage and the second voltage to power inputs of each of the first operational amplifiers.