Flow Modulation Element for CVD Deposition Uniformity

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

In thin film deposition processes like CVD and PECVD, uniformity of film deposition across substrates is compromised due to spatial variations in momentum, thermal, and concentration boundary layers, particularly near the edges of substrates, leading to non-uniform mass transport and thermal transport.

Innovation Solution

The implementation of a flow modulation element that introduces an additive process gas beyond the peripheral edge of the substrate in a direction parallel to its surface, perturbing the boundary layer to enhance uniformity by injecting mass and momentum, thereby inflating the boundary layer and improving gas flow distribution.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If conventional gas distribution is used in CVD/PECVD processes, then the deposition process can proceed, but spatial variations in boundary layers cause non-uniform mass and thermal transport, leading to poor deposition uniformity across the substrate

Engineering Contradiction:
Improvedeposition uniformityVSAvoidprocess complexity
Core Design Contradiction:
Manufacturing precisionVSEase of operation

Solution Approach 1:

The gas distribution system is segmented into multiple zones: a central gas distribution system for the main process gas and a peripheral flow modulation element for additive process gas. This segmentation allows independent control of gas flow in different regions of the substrate, enabling uniform boundary layer characteristics across the entire substrate surface while maintaining a relatively simple overall system architecture.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

An additive process gas is introduced as an intermediary substance through the flow modulation element. This intermediary gas modifies the boundary layer characteristics by injecting mass and momentum, thereby improving mass and thermal transport without requiring fundamental changes to the main process gas distribution system.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Manufacturing precision

If the boundary layer is left undisturbed near substrate edges, then the gas flow remains stable, but the boundary layer narrows and creates gradients that reduce deposition uniformity

Engineering Contradiction:
Improvedeposition uniformityVSAvoidboundary layer stability
Core Design Contradiction:
Manufacturing precisionVSStability of the object's composition

Solution Approach 1:

The flow modulation element changes key parameters of the boundary layer by introducing additive process gas with different momentum and concentration characteristics. This modifies the boundary layer thickness and flow velocity profile, creating more uniform mass and thermal transport conditions across the substrate while maintaining overall flow stability through controlled gas introduction.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach leads to more uniform film deposition across the substrate by mitigating the narrowing of boundary layers and gradients near the edges, resulting in improved deposition uniformity and process consistency.

Implementation Method 1

introducing an additive process gas beyond the peripheral edge of the substrate in a direction substantially away from the substrate and having a directional component substantially parallel to the upper surface of the substrate, thereby perturbing the boundary layer

Methodology Applied
Scientific EffectBoundary layer perturbation: Boundary Layer

Implementation Method 2

enhance uniformity by injecting mass and momentum, thereby inflating the boundary layer

Methodology Applied
Scientific EffectMass and momentum injection:

Implementation Method 3

a continuous stream of film precursor vapor is introduced to a process chamber containing a substrate, wherein the composition of the film precursor has the principal atomic or molecular species found in the film to be formed on the substrate

Methodology Applied
Scientific EffectChemical vapor deposition: Chemical Vapour Deposition

Implementation Method 4

the precursor vapor is chemisorbed on the surface of the substrate while it thermally decomposes and reacts

Methodology Applied
Scientific EffectChemisorption: Chemisorption

Implementation Method 5

the precursor vapor is chemisorbed on the surface of the substrate while it thermally decomposes and reacts

Methodology Applied
Scientific EffectThermal decomposition: Thermolysis

Implementation Method 6

plasma excitation generally allows film-forming reactions to proceed at temperatures that are significantly lower than those typically required to produce a similar film by thermally excited CVD

Methodology Applied
Scientific EffectPlasma excitation: Plasma

Implementation Method 7

In a PECVD process, the CVD process further includes plasma that is utilized to alter or enhance the film deposition mechanism

Methodology Applied
Scientific EffectPlasma enhanced chemical vapor deposition: Plasma Enhanced Chemical Vapour Deposition

Data Source

PatentUS8048226B2Method and system for improving deposition uniformity in a vapor deposition system
Publication Date: 2011.11.01 TOKYO ELECTRON LTD
  • US8048226B2 patent drawing
  • US8048226B2 patent drawing
  • US8048226B2 patent drawing

AI summary

A processing system for treating a substrate includes a process chamber, a substrate holder, a gas distribution system, and a flow modulation element. The process chamber has a pumping system to evacuate the process chamber. The substrate holder is coupled to the process chamber and supports the substrate. The gas distribution system is coupled to the process chamber. The gas distribution system introduces a process gas to a process space above an upper surface of the substrate. The flow modulation element is coupled to the substrate holder beyond a peripheral edge of the substrate. The flow modulation element includes one or more gas distribution openings that introduce an additive process gas beyond the peripheral edge of the substrate in a direction substantially away from the substrate. The additive process gas has a directional component substantially parallel to the upper surface of the substrate.