Flowable Spacer Material Prevents Solder Collapse in Flip-Chip Packaging

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Solution Overview

Problem

Conventional microelectronic devices face issues such as electrical shorts, inadequate gap formation, height variance, and die tilt during the reflow process due to the collapse of solder bumps, which complicates packaging and post-reflow processes.

Innovation Solution

The use of a flowable material with spacer elements is introduced between microelectronic dies and substrates, which prevents complete collapse of electrical couplers during reflow, maintaining a consistent gap and preventing electrical shorts, and includes a no-flow underfill or flux compound to ensure accurate spacing and secure attachment.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If solder bumps are reflowed to form solder joints between flip-chip and substrate, then mechanical and electrical connection is achieved, but solder bumps collapse causing electrical shorts and inadequate gap formation

Engineering Contradiction:
Improvesolder joint integrityVSAvoidgap consistency
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

Underfill material is applied to the substrate before the flip-chip is attached. This preliminary action ensures that the gap is already filled with protective material before reflow, preventing solder bump collapse and maintaining consistent gap dimensions throughout the bonding process

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

Underfill material acts as an intermediary substance between the solder bumps and the external environment. It supports the solder bumps during reflow, prevents their collapse, and maintains the intended gap geometry while allowing the solder joints to form reliably

Inventive Principle:
Principle #24Intermediary (Mediator)

2Area of stationary object

If die size is reduced to decrease footprint, then device density increases, but bond-pad array size decreases making packaging more difficult

Engineering Contradiction:
ImprovefootprintVSAvoidpackaging difficulty
Core Design Contradiction:
Area of stationary objectVSEase of manufacture

Solution Approach 1:

The invention changes the packaging approach by using underfill material and controlled reflow processes that are compatible with smaller bond-pad arrays. This allows fine-pitch flip-chip packaging to be performed reliably, enabling reduced die sizes and footprints without sacrificing manufacturability

Inventive Principle:
Principle #35Parameter changes

3Reliability

If underfill material is introduced to enhance joint integrity, then protection from stress and contaminants improves, but gap formation becomes more complex

Engineering Contradiction:
Improvejoint integrityVSAvoidpackaging process complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

Underfill material is applied in advance to the substrate before die attachment. This preliminary application simplifies the overall process by ensuring proper gap filling occurs automatically during the bonding process, eliminating the need for complex post-attachment gap formation steps

Inventive Principle:
Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution ensures uniform device height, prevents electrical shorts, and maintains accurate spacing between components, enhancing the reliability and consistency of microelectronic device packaging processes.

Implementation Method 1

The solder bumps are reflowed to form a solder joint between the flip-chip component and the substrate

Methodology Applied
Scientific EffectRefow: Melting

Implementation Method 2

The underfill material bears some of the stress placed on the components and protects the components from moisture, chemicals, and other contaminants

Methodology Applied
Scientific EffectStress bearing: Force

Implementation Method 3

a flowable material with spacer elements is introduced between microelectronic dies and substrates, which prevents complete collapse of electrical couplers during reflow, maintaining a consistent gap

Methodology Applied
Scientific EffectMechanical spacing: Mechanical Force

Data Source

PatentUS8597981B2Microelectronic devices and methods for manufacturing microelectronic devices
Publication Date: 2013.12.03 MICRON TECHNOLOGY INC
  • US8597981B2 patent drawing
  • US8597981B2 patent drawing
  • US8597981B2 patent drawing

AI summary

Microelectronic devices and methods for manufacturing microelectronic devices are disclosed herein. In one embodiment, a microelectronic device includes a microelectronic die, a plurality of electrical couplers projecting from the die, and a flowable material disposed on the die. The die includes an integrated circuit and a plurality of terminals operably coupled to the integrated circuit. The electrical couplers are attached to corresponding terminals on the die. The flowable material includes a plurality of spacer elements sized to space the die apart from another component. The flowable material may be a no-flow underfill, a flux compound, or other suitable material.