Fluorescence Measurement Angle Tuning for Multi-Wavelength Sensitivity
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Solution Overview
Problem
Existing methods for measuring fluorescent light from objects on substrates suffer from variations in fluorescent light enhancement effects due to differences in constructive interference positions of standing waves at different wavelengths, leading to inconsistent sensitivity across multiple illumination wavelengths.
Innovation Solution
Irradiating the object with multiple illumination light beams of different wavelengths at varying angles relative to the substrate to align the constructive interference positions of standing waves, using a substrate with a reflective layer and a dielectric layer to enhance fluorescent light detection sensitivity.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a substrate with reflective surface is used to enhance fluorescent light through standing waves, then measurement sensitivity is improved, but the constructive interference positions vary at different wavelengths causing inconsistent sensitivity across multiple illumination wavelengths
Solution Approach 1:
The patent changes the irradiation angle parameter of the illumination light beams to compensate for wavelength-dependent variations in constructive interference positions. By adjusting the irradiation angle according to the wavelength, the patent maintains consistent fluorescent light enhancement across multiple wavelengths, resolving the contradiction between measurement sensitivity and wavelength consistency.
2Adaptability or versatility
If multiple illumination light beams with different wavelengths are used to identify multiple targets, then measurement versatility is improved, but variations in constructive interference positions cause inconsistent measurement precision
Solution Approach 1:
The patent adjusts the irradiation angle parameter based on the wavelength of each illumination light beam. This allows the system to maintain optimal constructive interference conditions for each wavelength, enabling versatile multi-target identification while preserving measurement precision across all wavelengths.
3Measurement precision
If the irradiation angle is adjusted to align constructive interference positions, then measurement precision is improved, but the device complexity increases due to angle control mechanisms
Solution Approach 1:
The patent pre-calculates and sets the irradiation angles for different wavelengths before measurement begins. This preliminary configuration eliminates the need for complex real-time angle adjustment mechanisms during measurement, reducing device complexity while maintaining measurement precision.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Achieves consistent and high sensitivity in fluorescent light measurement across multiple wavelengths by aligning the constructive interference positions of standing waves, allowing for accurate identification of proteins and RNA in objects such as extracellular vesicles.
Implementation Method 1
standing waves of light are generated on the substrate due to interference between the incident and reflected light
Implementation Method 2
the reflective surface generates reflected light
Implementation Method 3
the fluorescent light emitted from the object is observed (measured)
Data Source
AI summary
methods, apparatuses, and storage media are provided herein. One or more methods for measuring fluorescent light from an object to be inspected that is placed on a substrate having a reflective surface, using a plurality of illumination light beams with different wavelengths includes irradiating the object with the illumination light beams, and detecting the fluorescent light emitted from the object. An irradiation angle of at least one of the plurality of illumination light beams relative to the substrate is different from an irradiation angle of another illumination light beam relative to the substrate.