Widefield Fluorescence Imaging Point Diffusion Model Construction
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Solution Overview
Problem
Existing widefield fluorescence imaging systems face inefficiencies in image enhancement due to lengthy processes involving three-dimensional light field distribution calculations, which affect imaging quality and processing efficiency.
Innovation Solution
An image enhancement method that uses fluorescent microspheres to directly collect and process half-peak full width values, constructing a point diffusion model for improved imaging, and iteratively processing sample images to achieve enhanced results.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If three-dimensional light field distribution calculation method is used to construct point diffusion model, then measurement precision is improved, but device complexity and processing time increase significantly
Solution Approach 1:
The patent extracts only the essential parameter (half-peak full width) needed for point diffusion model construction, eliminating the need for complex three-dimensional light field distribution calculations. This is achieved by directly measuring the half-peak full width value from fluorescent microsphere images, thereby simplifying the measurement process while maintaining model accuracy.
Solution Approach 2:
The patent performs preliminary measurement of the half-peak full width value using fluorescent microspheres before actual sample imaging. This pre-characterization approach allows the point diffusion model to be constructed in advance with simplified parameters, avoiding complex calculations during the main imaging process and reducing overall processing complexity.
2Measurement precision
If three-dimensional light field distribution calculation is performed at each defocusing distance, then point diffusion model accuracy is improved, but processing time increases
Solution Approach 1:
The patent extracts only the half-peak full width parameter from the imaging data, which can be obtained directly from in-focus images of fluorescent microspheres. This extraction approach eliminates the time-consuming process of calculating three-dimensional light field distributions at multiple defocusing distances, significantly reducing processing time while maintaining sufficient model accuracy.
Solution Approach 2:
The patent uses a partial measurement approach by measuring only the half-peak full width at the in-focus plane rather than performing complete three-dimensional light field distribution calculations at all defocusing distances. This partial action provides sufficient information for practical point diffusion model construction without the excessive time investment of full three-dimensional characterization.
3Manufacturing precision
If multiple processing steps including three-dimensional model conversion are performed, then imaging quality is improved, but productivity decreases
Solution Approach 1:
The patent extracts the critical half-peak full width parameter directly from fluorescent microsphere images, bypassing the need for three-dimensional model construction and conversion steps. This extraction method maintains the essential information needed for image deconvolution and quality improvement while eliminating unnecessary processing steps that reduce productivity.
Solution Approach 2:
The patent segments the point diffusion model construction process into a simple parameter measurement step (half-peak full width) separate from the main imaging workflow. This segmentation allows the model parameters to be determined independently and efficiently, improving overall processing efficiency without compromising imaging quality in the deconvolution step.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This method simplifies the processing workflow, improves imaging quality, and enhances processing efficiency by directly generating a point diffusion model based on half-peak full width values, reducing the complexity of three-dimensional light field distribution calculations.
Implementation Method 1
arranging fluorescent microspheres on an image plane of the widefield fluorescence microscope, and collecting, by the widefield fluorescence microscope, the microsphere image of the fluorescent microspheres
Data Source
AI summary
A widefield fluorescence imaging system, comprising: arranging fluorescent microspheres on an image plane of widefield fluorescence microscopy, and collecting, by the widefield fluorescence microscopy, the microsphere images of the fluorescent microspheres; processing, by the computer equipment, the microsphere image, to obtain the half-peak full width value of the fluorescent microspheres; constructing a point diffusion model based on the half-peak full width value in computer equipment; collecting a sample image by the widefield fluorescence microscope, and then processing, by the computer device, the sample image based on a point diffusion model to obtain an enhanced image. The beneficial effect is that by detecting the half-peak full width value of the fluorescent microspheres and using it in the construction process of the point diffusion model, the processing process is simplified and the processing efficiency is improved while achieving better imaging results.